DOI QR코드

DOI QR Code

Dielectric Function Analysis of Cubic CdSe Using Parametric Semiconductor Model

변수화 반도체 모델을 이용한 Cubic Zinc-blonde CdSe의 유전함수 분석

  • Jung, Y.W. (Nano-Optical Property Laboratory and Department of Physics, Kyung Hee University) ;
  • Ghong, T.H. (Nano-Optical Property Laboratory and Department of Physics, Kyung Hee University) ;
  • Lee, S.Y. (Nano-Optical Property Laboratory and Department of Physics, Kyung Hee University) ;
  • Kim, Y.D. (Nano-Optical Property Laboratory and Department of Physics, Kyung Hee University)
  • 정용우 (경희대학교 이과대학 물리학과 나노광물성 연구실) ;
  • 공태호 (경희대학교 이과대학 물리학과 나노광물성 연구실) ;
  • 이선영 (경희대학교 이과대학 물리학과 나노광물성 연구실) ;
  • 김영동 (경희대학교 이과대학 물리학과 나노광물성 연구실)
  • Published : 2007.01.31

Abstract

ZnCdSe alloy semiconductor was widely used for the optoelectronic device. And CdSe is the end-point in this material. In this work, we measured the dielectric function spectrum of cubic CdSe with Vacuum Ultra Violet spectroscopic ellipsometry and analysed this data with parametric model. As a result, we observed some of transition energy point over 6 eV and obtained the database for dielectric function spectrum, which could be used for temperature or alloy composition dependence study on optical property of CdSe.

본 연구에서는 광전자 소자에 폭넓게 사용되는 ZnCdSe 화합물 반도체의 end-point인 CdSe의 유전함수 spectrum을 Vacuum Ultra Violet spectroscopic ellipsometry(타원편광분석법) 측정하여 분석하였다. 측정 결과는 변수화 모델을 이용하여 분석하였으며 그 결과 6 eV 이상에 존재하는 전자전이점들을 확인할 수 있었고 CdSe의 Critical Point(CP) 구조를 수치화 함으로써 온도나 화합물 함량에 따른 광특성 의존성 연구 등에 활용될 수 있는 database를 확보하였다.

Keywords

References

  1. M. A. Haase, J. Qiu, J. M. DePuydt, and H. Cheng, Appl. Phys. Lett. 59, 1272 (1991) https://doi.org/10.1063/1.105472
  2. T. K. Bergstresser and M. L. Cohen, Phys. Rev. 164, 1069 (1967) https://doi.org/10.1103/PhysRev.164.1069
  3. D. J. Stukel, R. N. Euwema, and T. C. Collins, Phys. Rev. 179, 740 (1969) https://doi.org/10.1103/PhysRev.179.740
  4. S. Ninomiya and S. Adachi, J. Appl. Phys. 78, 4681 (1995) https://doi.org/10.1063/1.359815
  5. C. Janowitz, O. Günther, G. Jungk, R. L. Johnson, P. V. Santos, M. Cardona, W. Faschinger, and H. Sitter, Phys. Rev. B. 50, 2181 (1994) https://doi.org/10.1103/PhysRevB.50.2181
  6. U. Lunz, J. Kuhn, F. Goschenhofer, U. Schüssler, S. Einfeldt, C. R. Becker, and G. Landwehr, J. Appl. Phys. 80, 6861 (1996) https://doi.org/10.1063/1.363753
  7. Y. D. Kim, M. V. Klein, S. F. Ren, and Y. C. Chang, Phys. Rev. B 49, 7262 (1994) https://doi.org/10.1103/PhysRevB.49.7262
  8. J. R. Chelikowsky and M. L. Cohen, Phys. Rev. 14, 556 (1976) https://doi.org/10.1103/PhysRevB.14.556
  9. A. S. Nasibov, Y. V. Korostelin, P. V. Shapin, L. G. Suslina, D. L. Fedorov, and L. S. Matkov, Solid State Commun. 71, 867 (1989) https://doi.org/10.1016/0038-1098(89)90175-0
  10. H. Luo, N. Samarthm F. C. Zhang, A. Pareek, M. Dobrowolska, J. K. Furdyna, K. Mahalingam, N. Stsuka, W. C. Chou, A. Petrou, and S. B. Qadri, Appl. Phys. Lett. 58, 1783 (1991) https://doi.org/10.1063/1.105090
  11. N. Samarth, H. Luo, J. K. Furdyna, S. B. Qadri, Y. R. Lee, R. G. Alonso, E. K. Suh, A. K. Ramsas, and N. Otsuka, Surf. Sci. 228, 226 (1990) https://doi.org/10.1016/0039-6028(90)90297-L
  12. N. Samarth, H. Luo, J. K. Furdyna, R. G. Alonso, Y. R. Lee, E. K. Suh, A. K. Ramsas, S. B. Qadri, and N. Otsuka, Appl. Phys. Lett. 56, 1163 (1990) https://doi.org/10.1063/1.102550
  13. B. Johs, C. M. Herzinger, J. H. Dinan, A. Cornfeld, and J. D. Benson, Thin Solid Films 313, 137 (1998) https://doi.org/10.1016/S0040-6090(97)00800-6
  14. Guide to Using WVASE32 (J. A. Woollam Co. Inc., 2000), pp. Software for Spectroscopic Ellipsometry Data Acquisition and Analysis
  15. F. Seitz, D. Turnbell, H. Ehrenreich, Modulation Spectroscopy (Academic Press, New York, 1969)
  16. M. Balkanski, Handbook on Semiconductors (North- Holland, Amsterdam, 1980), pp. 109