DOI QR코드

DOI QR Code

The effects of TiO2 interlayer phase transition on structural and electrical properties of PLZT Thin Films

TiO2 Interlayer의 상변화에 따른 PLZT 박막의 구조 및 전기적 특성

  • Lee, Chul-Su (School of Materials Science and Engineering, Pusan National University) ;
  • Yoon, Ji-Eon (School of Materials Science and Engineering, Pusan National University) ;
  • Hwang, Dong-Hyun (School of Materials Science and Engineering, Pusan National University) ;
  • Cha, Won-Hyo (School of Materials Science and Engineering, Pusan National University) ;
  • Sona, Young-Gook (School of Materials Science and Engineering, Pusan National University)
  • 이철수 (부산대학교 공과대학 재료공학부) ;
  • 윤지언 (부산대학교 공과대학 재료공학부) ;
  • 황동현 (부산대학교 공과대학 재료공학부) ;
  • 차원효 (부산대학교 공과대학 재료공학부) ;
  • 손영국 (부산대학교 공과대학 재료공학부)
  • Published : 2007.11.30

Abstract

[ $(Pb_{1.1},La_{0.08})(Zr_{0.65}.Ti_{0.35})O_3$ ] thin films on the $Pt/Ti/SiO_2/Si$, $TiO_2(interlayer)/Pt/Ti/SiO_2/Si$ substrate were fabricated by the R.F. magnetron-sputtering method and considered their characteristics depending on $TiO_2$ interlayer. Changing the deposition conditions of $TiO_2$ interlayer, we obtained $TiO_2$ anatase single phase and rutile single phase. PLZT was deposited on these substrates and analyzed by x-ray diffraction(XRD) for there crystallinity and orientation. To investigate $PLZT-TiO_2$, $TiO_2-Pt$ interface, glow discharge spectrometer(GDS) analysis was carried out and we performed electrical measurements for dielectric properties of PLZT thin films. The PLZT thin film on $TiO_2$ anatase interlayer was found to have (110)-preferred orientation and 12.6 ${\mu}C/cm^2$ remaining polarization value.

R.F. magnetron-sputtering 방법에 의해 $(Pb_{1.1},La_{0.08})(Zr_{0.65}.Ti_{0.35})O_3$ 박막을 $Pt/Ti/SiO_2/Si$, $TiO_2(interlayer)/Pt/Ti/SiO_2/Si$ 기판에 증착하고, $TiO_2$ interlayer에 의한 PLZT 박막의 특성을 고찰 하였다. $TiO_2$ interlayer의 증착조건을 변화시켜가며 단일상의 anatase 상과 rutile 상을 증착하였고, 그 위에 증착시킨 PLZT 박막의결정성을 x-ray diffraction(XRD)을 통해 분석하였다. 또한 $TiO_2$ interlayer에 의한 $PLZT-TiO_2$, $TiO_2-Pt$ 박막의 계면상태를 고찰하기 위해 glow discharge spectrometer(GDS) 분석을 행하였고, PLZT의 강유전 특성을 고찰하기 위해 전기적 측정을 행하였다. $TiO_2$ anatase 단일 상에 증착한 PLZT의 경우 (110) 방향으로 우선 배향됨을 알 수 있었고, 12.6 ${\mu}C/cm^2$의 잔류분극 값을 나타내었다.

Keywords

References

  1. G.H. Haertling, and C.E. Land, j. Amer Ceram. Soc. 54, 1-11 (1971) https://doi.org/10.1111/j.1151-2916.1971.tb12154.x
  2. C.H. Jeon, C.S. Kim, K.B. Han, H.S. Jhon, and S.Y.Lee, Mater. Sci. Eng. B 109, 141 (2004) https://doi.org/10.1016/j.mseb.2003.10.033
  3. D. H. Chang, and Y. S. Yoon, J. Korean Phys. Soc. 38, 277 (2001)
  4. J. W. Hyun and G. b. Lim, J. Korean Phys. Soc. 42, 139 (2003)
  5. S. H. Hwang and H. J. Chang, J. Korean Phys. Soc. 41, 139 (2002)
  6. Xunhu Dai, A. DiGiovanni, and Dwight Viehland, J. Appl. Phys. 74. 5 (1993)
  7. R. Thomas, S. Mochizuki, T. Mihara, and T. Ishida, J. Mat. Res. 17, 2652 (2002) https://doi.org/10.1557/JMR.2002.0385
  8. G. Leclerc, B. Domenge`s, G. Poullain, and R. Bouregba, Applied Surface Science 253, 1143-1149 (2006) https://doi.org/10.1016/j.apsusc.2006.01.048
  9. M. Gaidi, A. Amassian, M. Chaker, M. Kulishov, and L. Martinu, Applied Surface Science 226, 347-354 (2004) https://doi.org/10.1016/j.apsusc.2003.10.037
  10. K. Bouayad, S. Sayouri, T. Lamcharfil, M. Ezzejari, D. Mezzane, L. Hajji, A. El Ghazouali, M. Filalil, P. Dieudonn'e, and M. Rhouta, Physica A 358, 175-183 (2005) https://doi.org/10.1016/j.physa.2005.06.021
  11. Reji Thomas, Shoichi Mochizuki, Toshiyuki Mihara, and Tadashi Ishida, Thin Solid Films. 443, 14-22 (2003) https://doi.org/10.1016/S0040-6090(03)00926-X
  12. B. Tunaboylu, C.S. Ozkan, A. Ata, K. Ring, and S. Esener, Materials Science in Semiconductor Processing 5, 199-206 (2003) https://doi.org/10.1016/S1369-8001(02)00073-2
  13. Jae-Yeol Hwang, Se-Young Jeong, and Chae-Ryong Cho, Journal of korean Physical Society, 42, 1093-1096 (2003)
  14. He Linxiang, Yu Jun, Yang Weiming, Li Jia, Yang Bin, and Wang Yunbo, Solid State Communications 142, 472-476 (2007) https://doi.org/10.1016/j.ssc.2007.03.032
  15. Chen Zhu, Yang Chentao, Li Bo, and Yang Bangchao, Materials Letters 60, 1559- 1564 (2006) https://doi.org/10.1016/j.matlet.2005.11.075
  16. E. Hong, R. Smith, S.V. Krishnaswamy, C.B. Freidhoff, and S. Trolier-McKinstry, Thin Solid Films 510 213 (2006) https://doi.org/10.1016/j.tsf.2005.12.300
  17. V. Reymond, D. Michau, S. Payan, and M. Mglione, Ceramics International 30, 1085–1087 (2004)