Journal of the Korean Institute of Electrical and Electronic Material Engineers (한국전기전자재료학회논문지)

The Korean Institute of Electrical and Electronic Material Engineers (한국전기전자재료학회)
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Stability and Improvement of Polishing Pad in W CMP

W CMP 공정에서의 연마패드표면 안정화 상태와 그 개선

  • Published : 2007.12.01
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Abstract

In this research, the polishing pad for W CMP has been analyzed to understand stabilization of polishing performance. For stabilization of process, the polishing pad condition is one of important factors. The polishing pad plays a key role in polishing process, because it contact with reacted surface of wafer[1]. The physical property of pad surface is ruled by conditioning tool which makes roughness and profile of pad surface. Pad surface affects on polishing performance such as RR(Removal Rate) and uniformity in CMP. The stabilized pad surface has stable roughness. And its surface has high level of wettability which can increase the probability of abrasive adhesion on pad. The result of this research is that the reduction of break-in and dummy polishing process were achieved by artificial machining to make stable pad surface. In this research, urethane polishing pad which is named IC pad(Nitta-Haas Inc.) and has micro pore structure, is studied. Because, this type of pad is the most conventional type.

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References

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Cited by

  1. Statistical Analysis on Process Variables in Linear Roll-CMP vol.30, pp.3, 2014, https://doi.org/10.9725/kstle.2014.30.3.139
  2. A Study on the Polishing Characteristics Using Floating Nozzle in Linear Roll CMP vol.32, pp.7, 2015, https://doi.org/10.7736/KSPE.2015.32.7.627