참고문헌
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T. Lauinger, J. Schmidt, A.G. Aberle, and R. Hezel, 'Record Low Surface Recombination Velocities on 1
$\Omega$ cm P-silicon Using Remote Plasma Silicon Nitride Passivation,' Appl. Phys. Lett., 68 [9] 1232-34 (1996) https://doi.org/10.1063/1.115936 - N. Shibata, 'Improvement of Solar Cell Performance Using Plasma-Deposited Silicon Nitride Films with Variable Refractive Indices,' J. Jap. Appl. Phys., 27 [4] 480-84 (1988) https://doi.org/10.1143/JJAP.27.480
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Please visit an web site, http://www.ee.byu.edu/photonics/ ARcoatings.phtml, calculate the reflectance and thickness for the film of n= 2.35 on silicon substrate at 635 nm (
$\lambda$ )