ETRI Journal
- 제28권3호
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- Pages.355-363
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- 2006
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- 1225-6463(pISSN)
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- 2233-7326(eISSN)
A New Approach for Built-in Self-Test of 4.5 to 5.5 GHz Low-Noise Amplifiers
- Ryu, Jee-Youl (Department of Electronic Engineering, Arizona State University) ;
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Noh, Seok-Ho
(Department of Electronic & Information Engineering, Andong National University)
- 투고 : 2004.08.31
- 발행 : 2006.06.30
초록
This paper presents a low-cost RF parameter estimation technique using a new RF built-in self-test (BIST) circuit and efficient DC measurement for 4.5 to 5.5 GHz low noise amplifiers (LNAs). The BIST circuit measures gain, noise figure, input impedance, and input return loss for an LNA. The BIST circuit is designed using