LCD 검사장비기술의 현황과 과제

  • 정대화 (LG전자 생산기술원 검사기술그룹)
  • 발행 : 2006.04.23

초록

키워드

참고문헌

  1. Xianhai Chen, 'New-Generation Electro-Optic Modulator for TFT Array Inspection', SID 05 Digest, p.1792
  2. J. Craig Hunter, Matthias Brunner, Ralf Schmid, Frank Abboud, 'Issues and Challenges Associated with Electrical Testing of Large LCD-TV Arrays', SID 05 Digest, p.1802
  3. 'Surface and Edge Inspection of Flat Panels for Efficient Process Control', Tech Note, 2005, dr. schenk
  4. LG전자, 'LCD Micro Short Detector & Repair', IR52 2004년 41주차
  5. LG전자, 'LCD Micro Shohrt 위치 검출 기술' 신기 술인정협의회(KT), 2004년 3차 인정기술
  6. Byoungcho Park, JW. WU and Chi-Sub Jnug, 'Brewster Angle Microscope Imaging of Surface Inhomogeity in Liquid Crystal Alignment Polyimide Layers', Jpn. J. Appl. Phys. Vol. 40 (2001) pp. L691-L694 https://doi.org/10.1143/JJAP.40.L691