References
- M. E. McHenry, M. A. Willard, and D. E. Laughlin, Prog. Mater. Sci. 44, 291 (1999) https://doi.org/10.1016/S0079-6425(99)00002-X
- Y. Yoshizawa, S. Oguma, and K. Yamauchi, J. Appl. Phys. 64, 6044 (1988) https://doi.org/10.1063/1.342149
- P. Martin, M. Lopez, A. Hernando, Y. Iqbal, H. A. Davies, and M. R. J. Gibbs, J. Appl. Phys. 92, 374 (2002) https://doi.org/10.1063/1.1485109
- R. Alben, J. J. Becker, and M. C. Chi, J. Appl. Phys. 49, 1653 (1978) https://doi.org/10.1063/1.324881
- G. Herzer, IEEE. Trans. Magn. 25, 3327 (1989) https://doi.org/10.1109/20.42292
- U. Koster, Mater. Sci. Eng. 97, 233 (1988) https://doi.org/10.1016/0025-5416(88)90049-3
- A. Gupta, and S. Habibi, Mater. Sci. Eng. A. 133, 375 (1991) https://doi.org/10.1016/0921-5093(91)90091-Z
- A. Slawska-Waniewska, A. Witck, and A. Reich, Mater. Sci. Eng. A. 133, 363 (1991) https://doi.org/10.1016/0921-5093(91)90088-5
- A. K. Panda, M. Manimaran, A. Mitra, and S. Basu, Appl. Surf. Sci. 235, 475 (2004) https://doi.org/10.1016/j.apsusc.2004.03.254
- S. H. Lim, W. K. Pi, T. H. Noh, H. J. Kim, and I. K. Kang, J. Appl. Phys. 73, 6591 (1993) https://doi.org/10.1063/1.352574
- C. G. Polo, P. Martin, L. Pascual, A. Hernando, and M. Vazquez, Phys. Rev B. 65, 24433 (2001) https://doi.org/10.1103/PhysRevB.65.024433
- M. H. Phan, H. X. Peng, S. C. Yu, N. D. Tho, and N. Chau, Acta. Mater (submitted)
- P. Agudo, and M. Vazquez, J. Appl. Phys. 97, 23901 (2005) https://doi.org/10.1063/1.1825633
- C. G. Polo, et al., J. Magn. Magn. Mater. 290, 1517 (2005) https://doi.org/10.1016/j.jmmm.2004.11.564
- N. Chau, N. Q. Hoa, and N. H. Luong, J. Magn. Magn. Mater. 290, 1547 (2005) https://doi.org/10.1016/j.jmmm.2004.11.245
- Heebok Lee, Y. K. Kim, K. J. Lee, and T. K. Kim, J. Magn. Magn. Mater. 215, 310 (2000) https://doi.org/10.1016/S0304-8853(00)00143-8
- M. H. Phan, H. X. Peng, M. R. Wiscom, S. C. Yu, and N. Chau, Composites, Part A (inpress)
- B. D. Cullity, Elements of X-ray diffraction, 2nd Ed, Addison-Wesley Publishing Company, Inc., Reading, MA (1978), pp. 102
- J. D. Ayers, V. G. Harris, J. A. Sprague, and W. T. Elam, J. Appl. Phys. 64, 974 (1994)
- V. M. Prida, P. Gorria, G. V. Kurlyandskaya, M. L. Sanchez, B. Hernando, and M. Tejedor, Nanotechnology. 14, 231 (2003) https://doi.org/10.1088/0957-4484/14/2/325
- M. H. Phan, H. X. Peng, M. R. Wiscom, S. C. Yu, and N. Chau, Phys. Status Solidi A 201, 1558 (2004) https://doi.org/10.1002/pssa.200306791
- L. V. Pannia, K. Mohri, T. Uchiyama, and M. Noda, IEEE Trans. Magn. 31, 1249 (1995) https://doi.org/10.1109/20.364815