References
- C. Wiemer, R. Sanjines, F. Levy, Surf. Coat. Technol., 86-87 (1996) 372
- Q. Yang, L. R. Zhao, P. C. Patnaik, X. T. Zeng, Wear, 261 (2006) 119-125 https://doi.org/10.1016/j.wear.2005.07.008
- F. Regent, J. Musil, Surf. Coat. Technol., 142-144 (2001) 146 https://doi.org/10.1016/S0257-8972(01)01250-6
- R. Sanjines, C. Wiemer, J. Almeida, F. Levy, Thin Solid Films, 290-291 (1996) 334 https://doi.org/10.1016/S0040-6090(96)09082-7
- M. Diserens, J. Patscheider, F. Levy, Surf. Coat. Technol., 108-109 (1998) 241 https://doi.org/10.1016/S0257-8972(98)00560-X
- S. Veprek, S. Reiprich, L. Shizhi, Appl. Phys. Lett., 66 (1999) 2640 https://doi.org/10.1063/1.113110
- F. Vaz, L. Rebouta, P. Goudeau, J. Pacaus, H. Garem, J. Riviere, A. Cavaleiro, E. Alves, Surf. Coat. Technol., 133-134 (2000) 307 https://doi.org/10.1016/S0257-8972(00)00947-6
- S. Veprek, M. Haussmann, S. Reiprich, Li Shizhi, J. Dian, Surf. Coat. Technol., 86-87 (1996) 394 https://doi.org/10.1016/S0257-8972(96)02988-X
- S. Veprek, A. Niederhofer, K. Moto, T. Bolom, H. -D. Mannling, P. Nesladek, G. Dollinger, A. Bergmaier., Surf. Coat. Technol., 133-134 (2000) 152 https://doi.org/10.1016/S0257-8972(00)00957-9
- S. Veprek, J. Vac. Sci. Technol., A 17 (5) (1999) 2401
- F. Vaz, L. Rebouta, S. Ramos, M. F. da Silva, J.C. Soares, Surf. Coat. Technol., 108-109 (1998) 236 https://doi.org/10.1016/S0257-8972(98)00620-3
- K. H. Kim, S.-R. Choi, S.-Y. Yoon, Surf. Coat. Technol., 298 (2002) 243
- J. L. He, C. K. Chen, M. H. Hon, Wear, 181-183 (1995) 189 https://doi.org/10.1016/0043-1648(94)07050-4
- J. B. Choi, K. Cho, M.-H. Lee, K. H. Kim, Thin Solid Films, 447-448 (2004) 365-370 https://doi.org/10.1016/S0040-6090(03)01083-6
- M. Diserens, J. Patscheider, F. Levy, Surf. Coat. Technol., 120-121 (1999) 158
- S. Veprek, Surf. Coat. Technol., 97 (1997) 15 https://doi.org/10.1016/S0257-8972(97)00279-X
- J. Patscheider, T. Zehnder, M. Diserens, Surf. Coat. Technol., 146-147 (2001) 201 https://doi.org/10.1016/S0257-8972(01)01389-5
- W. J. Meng, X. D. Zhang, B. Shi, J. C. Jiang, L. E. Rehn, P. M. Baldo, R. C. Tittsworth, Surf. Coat. Technol., 163-164 (2003) 251 https://doi.org/10.1016/S0257-8972(02)00603-5
- L.-W. Park, S. R. Choi, J. H. Suh, C.-G. Park, K. H. Kim, Thin Solid Films, 447-448 (2004) 415
- J. F. Moulder, W. F. Stickle, P. E. Sobol, K. D. Bomben, Handbook of X-ray Photoelectron Spectroscopy, Physical Electronics, Inc., Minnesota, (1995) 238-240
- K. H. Kim, S.-R. Choi, S.-Y. Yoon, Surf. Coat. Technol., 298 (2002) 243-248
- J.-H. Jeon, S. R. Choi, W. S. Chung, K. H. Kim, Surf. Coat. Technol., 188-189 (2004) 415-419 https://doi.org/10.1016/j.surfcoat.2004.08.042
- M. P. Delplancke-Ogletree, O. R. Monteiro, Surf. Coat. Technol., 108-109 (1998) 484-488 https://doi.org/10.1016/S0257-8972(98)00572-6