The Transactions of the Korean Institute of Electrical Engineers D (대한전기학회논문지:시스템및제어부문D)

The Korean Institute of Electrical Engineers (대한전기학회)
권호 표지

Detection of Lens Scan Alluk on LCD Surface

LCD 표면의 렌즈 스캔 얼룩 검출 기법

  • 신지영 (이화여자대학 전자정보통신학과) ;
  • 김정태 (이화여자대학 전자정보통신학과)
  • Published : 2006.12.01
Download PDF
⟨ Previous Next ⟩

Abstract

We have proposed a novel algorithm for detecting scan alluk on the surface of a TFT-LCD device that is generated by non-uniform exposure during fabrication. The scan alluk is known to have similar intensity values on paths that are determined by the shape of lens for light exposure. Based on the observation, the proposed algorithm inspects the uniformity on the paths using 1D projection image of 2D LCD image and 2D backprojection image of the 1D image. We have shown the usefullness of the proposed method by theoretical analysis and experimental results.

Keywords

References

  1. Y. Mori, K. Tanahashi, R. Yoshitake, S. Tsuji, 'Extraction and evaluation of mura images in liquid crystal displays,' Proceedings of SPIE, Vol. 4471, 2001 https://doi.org/10.1117/12.449348
  2. J. S. Lim, Two-dimensional signal and image processing, Prentice Hall, 1989
  3. H. L. Van Trees, Detection, estimation and modulation theory, Wiley Interscience, 2001
  4. J. Kim, J. A. Fessler, 'Intensity-based image registration using robust correlation coefficients,' IEEE transactions on medical imaging, Vol. 23, No. 11, pp. 1430-1444, 2004 https://doi.org/10.1109/TMI.2004.835313