Defect Detection of Flat Panel Display Using Wavelet Transform

웨이블릿 변환을 이용한 FPD 결함 검출

  • 김상지 (㈜ 쓰리비 시스템) ;
  • 이연주 (이화여자대학교 수학과) ;
  • 윤정호 (이화여자대학교 수학과) ;
  • 유훈 (동서대학교 컴퓨터정보공학부) ;
  • 이병국 (동서대학교 컴퓨터정보공학부) ;
  • 이준재 (동서대학교 컴퓨터정보공학부)
  • Published : 2006.08.25


Due to the uneven illumination of FPD panel surface, it is difficult to detect the defects. The paper proposes a method to find the uneven illumination compensation using wavelets, which are done based on multi-resolution structure. The first step is to decompose the image into multi-resolution levels. Second, elimination of lowest smooth sub-image with highest frequency band removes the high frequency noise and low varying illumination. In particular, the main algorithm was implemented by lifting scheme for realtime inline process.