Transactions of the Korean Society of Mechanical Engineers B (대한기계학회논문집B)

The Korean Society of Mechanical Engineers (대한기계학회)
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Characterization of submicron Particles Using a Single Particle Mass Spectrometer(I) - Non - Linear Correlation Between Particle Size and Mass Spectra Signals -

단일입자 질량분석기를 애용한 서브마이크론 입자의 특성화(I) - 입자의 크기와 질량분광신호의 비선형성 -

  • Zachariah Michael R. (Dept. of Mechanical Eng., University of Maryland) ;
  • Lee Donggeun
  • Published : 2005.04.01
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Abstract

In this paper, we are proposing a robust tool which is capable of measuring the size and elemental composition of submicron particles from twenty to several hundreds nanometers at the same time, i.e., named Single Particle Mass Spectrometer (SPMS). The home-made SPMS employs a laser ablation/multi-photon ionization method to tear a nanoparticle into the constituent elemental ions. One thing different from the conventional Aerosol Time-of-Flight Mass Spectrometer (ATOFMS) is the power of the ionization laser. Much strong laser used in this work makes it possible to generate elemental ions rather than molecular ions from a nanoparticle. Also the use of high power laser may guarantee a complete ionization of a particle, which was confirmed by the existence of multiple charged ions. If a particle is evaporated/ionized completely and detected through electric field-free TOF tube without any loss, we can extract the original particle volume from the measured total ion numbers. Collecting a number of particles mass spectra, we get a database of size and elemental composition of nanoparticles, with which we may take a took into any kinds of chemical reaction occurring at nanoscale. Several issues related to size estimation by SPMS will be discussed.

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References

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