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파장판를 이용한 스펙클패턴 전단간섭법에 있어서의 위상오차 해석

Phase Error Analysis in Shearography Using Wave Plates

  • 김수길 (호서대학교 전기정보통신공학부)
  • 발행 : 2005.01.01

초록

본 논문에서는 Wollaston 프리즘을 이용한 스펙클패턴 전단간섭법(shearography)에서 수동소자인 두 개의 파장판과 편광판의 조합을 통해 각각 90도의 위상천이를 가지는 4개의 스펙클 패턴을 얻고, 이로부터 스펙클패턴의 각 지점에서의 위상을 얻을 수 있는 방법을 제시하였다. 제안된 방법에 사용되는 파장판에 의한 위상오차를 Jones 행렬을 이용하여 분석하였다.

We presented the method to obtain four speckle patterns with relative phase shift of ${\pi}/2$ by passive devices such as wave plate and polarizer, and calculate the phase at each point of the speckle pattern in shearography using Wollaston prism. And, we analyzed the phase error caused by wave plates used in the proposed method by Jones matrix.

키워드

참고문헌

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