Journal of the Institute of Electronics Engineers of Korea CI (전자공학회논문지CI)

The Institute of Electronics and Information Engineers (대한전자공학회)
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A New Immunotronic Approach to Hardware Fault Detection Using Symbiotic Evolution

공생 진화를 이용한 Immunotronic 접근 방식의 하드웨어 오류 검출

  • 이상형 (연세대학교 전기전자공학과) ;
  • 김은태 (연세대학교 전기전자공학과) ;
  • 이희진 (국립 한경대학교 정보제어공학과) ;
  • 박민용 (연세대학교 전기전자공학과)
  • Published : 2005.09.25
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Abstract

A novel immunotronic approach to fault detection in hardware based on symbiotic evolution is proposed in this paper. In the immunotronic system, the generation of tolerance conditions corresponds to the generation of antibodies in the biological immune system. In this paper, the principle of antibody diversity, one of the most important concepts in the biological immune system, is employed and it is realized through symbiotic evolution. Symbiotic evolution imitates the generation of antibodies in the biological immune system morethan the traditional GA does. It is demonstrated that the suggested method outperforms the previous immunotronic methods with less running time. The suggested method is applied to fault detection in a decade counter (typical example of finite state machines) and MCNC finite state machines and its effectiveness is demonstrated by the computer simulation.

본 논문에서는 하드웨어 오류 검출을 위하여 공생 진화(symbiotic evolution)에 기반을 둔 새로운 immunotronic 알고리즘을 제안한다. 면역학(immunology)과 전자공학(Electronics)을 결합한 immunotronic 시스템에서 가장 중요한 점은 포용 조건 (tolerance condition)을 생성하는 방식이다. 여기서 포용 조건 생성은 생체 면역 시스템에서의 항체 생성을 의미한다. 본 논문에서는 생체 면역 시스템에서 매우 중요한 개념인 항체의 다양성 원리(principle of antibody diversity)를 포용 조건 생성에 적용한 후 공생 진화를 통하여 이를 구현한다. 공생 진화는 기존의 유전자 알고리즘(standard genetic algorithm, SGA)에 비해서 더욱 더 생체 면역 시스템이 항체를 생성하는 방식과 유사하며 이러한 방식은 이전의 immunotronic 방식에 비해서 더 향상된 비자기 검출 율을 보여 준다. 이렇게 제안된 알고리즘을 FSM(Finite State Machine)의 가장 전형적인 예인 십진 카운터와 MCNC benchmark FSM에 적용한 후 컴퓨터 모의 실험을 통해 그 성능을 확인한다.

Keywords

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