한국신뢰성학회지:신뢰성응용연구 (Journal of Applied Reliability)
- 제5권1호
- /
- Pages.167-180
- /
- 2005
- /
- 1738-9895(pISSN)
- /
- 2733-8320(eISSN)
엄격한 고장판정기준을 적용한 비복원 열화시험 설계에 관한 연구
Design of Degradation Test without Replacement Based on Tightened Critical Value
-
Park Boo Hee
(Department of Industrial Engineering, Ajou University) ;
- Lim Ho Kyung (Department of Industrial Engineering, Ajou University) ;
-
Jang Joong Soon
(Department of Industrial Engineering, Ajou University)
- 발행 : 2005.03.01
초록
Design of a degradation test without replacement is considered based on tightened critical value to reduce the evaluation testing time. The sample size, number of inspections, and the critical values are determined to assure the same probability of acceptance when the testing time is reduced to some degree. Photo-diode balance of an optical pickup is analyzed as a case study.
키워드