References
- Hirth JP, Lothe J: Theory of Dislocations. McGraw-Hill, Inc. 1968
- Hull D, Bacon DJ: Introduction to Dislocations. 3rd ed., Butterworth-Heinemann, 1984
- Cherns D, Preston AR: Convergent Beam Diffraction Studies of Interfaces, Defects and Multilayers. J. Electron Microscopy Tech. 13 : 111-122, 1989 https://doi.org/10.1002/jemt.1060130204
- Humphrey CJ, Maher DM, Fraser HL, Eaglesham DJ: Convergent-beam imaging-a transmission electron microscopy technique for investigating small-localized distortions in crystals. Phil. Mag. A: 58 : 787-798, 1988 https://doi.org/10.1080/01418618808209953
- Perez R: On the Characterization of Crystalline Defects Using CBED Techniques. Phys. Stat. sol. (a): 122 : 51-68, 1990 https://doi.org/10.1002/pssa.2211220104
- Cherns D, Touaitia R, Preston AR, Rossouw CJ, Houghton DC: Convergent beam electron diffraction studies of strain in Si/SiGe superlattices. Phil. Mag. A: 64 : 597-612, 1991 https://doi.org/10.1080/01418619108204862
- Chou CT, Preston AR, Steeds JW. Dislocation contrast in large angle convergent-beam electron diffraction patterns. Phil. Mag. A: 65 : 863-888, 1992 https://doi.org/10.1080/01418619208205595
- Tanaka M, Terauchi, Tsuda K: Convergent Beam Electron Diffraction III: JEOL Ltd., 156-177, 1994
-
Kim HS, Goodman P, Schwartzman A, Tulloch P, Forwood CT: LACBED study of a
${\Sigma}3$ grain boundary in a Cu+ 6 at.% Si alloy. Ultramicroscopy77 : 83-95, 1999 https://doi.org/10.1016/S0304-3991(99)00010-8 - Hirsch PB, Howie A, Nicholson RB, Pashley DW, Whelan MJ: Electron Microscopy of Thin Crystals. Krierger Publ., Huntington, New york, pp.640, 1977
- Head AK, Humble P, Clarebrough LM, Morton AJ, Forwood CT: Computed Electron Micrographs and Defect Identification. North-Holland Publ. Co., New York, pp. 71-2, 1973
- Kim HS: Asymmetry in Bright Field Images of Stacking Faults. Phys. Stat. Sol. (a): 90 : 231-240, 1985 https://doi.org/10.1002/pssa.2210900123
- Wu F, Armigliato A, Balboni R, Frabborni S: Dynamical simulation of LACBED patterns in cross-sectioned heterostructures. Micron: 31 : 211-216, 2000 https://doi.org/10.1016/S0968-4328(99)00085-2
- Kim HS: A New Formation of the diffraction Contrast Theory of Dislocations and its Application to the Weak Beam Images. Microsc. Microanal. 8: (Suppl. 2), 1416CD, 2002
- Kim HS, Kim JP: A Simple Method to Determination the Rotation Angle Between an Image and its Diffraction Pattern with LACBED Patterns. K. J. Electro. Micros. : 33 (3) : 187-193, 2003