References
- J. H. Swoger, C. Qiu, J. G. Simmons, D. A. Thompson, F. Shepherd, D. Beckett, and M. Cleroux, IEEE Photon. Techol. Lett., vol. 6, pp. 927, (1994) https://doi.org/10.1109/68.313054
- J. Swoger and J. G. Simmons, IEEE Trans. Electron Device, vol. 40, pp. 107, (1993) https://doi.org/10.1109/16.214731
- D.G.Kim, H.H.Lee, W.K.Choi, Y.W.Choi, S.Lee, D.H.Woo, J.H.Kim, Y.T.Byun, S.H.Kim, Appl. Phys. Lett., vol. 82, no.2 pp. 158-160, (2003) https://doi.org/10.1063/1.1536711
- W.K.Choi, D.G.Kim, Y.W.Choi, S.Lee, D.H.Woo, S.H.Kim, 전자공학회논문지, 41권, SD편, 1호, pp.29-34, (2003)
- H. Tsuda, K. Nonaka, K. Hirabayashi, H. Uenohara, H. Iwamura, and T. Kurokawa, Appl. Phys. Lett' vol. 63, no.23, pp.3116-3118, (1993) https://doi.org/10.1063/1.110221
- J. O'Gorman, A. F. J. Levi, T. Tanbun-ek, D. L. coblents, and R. A. Rogan, Electron. Lett., vol. 27, pp.1239 (1990) https://doi.org/10.1049/el:19910777
- M. Kuijk, P. L. Heremans, G. Borghs, and R. Vounckx, Appl. Phys. Lett., vol. 64, pp.2073-2075 (1994) https://doi.org/10.1063/1.111687
- D. G. Kim, J. J. Lee, Y. W. Choi, S. Lee, B. K. Kang, S. H. Kim, N. Futakuchi, and Y. Nakano, IEEE Photon. Technol. Lett, vol. 12, pp. 1219, (2000) https://doi.org/10.1109/68.874241
- H. Kawaguchi, K. Oe, H. Yasaka, K. Magari, M. Fukuda, and Y. Itaya, Electron. Lett. vol.23, pp.1088 (1987) https://doi.org/10.1049/el:19870760
- K. Takahata, K. Kasaya, and H. Yasaka, Electron. Lett. vol. 28, pp.2078 (1992) https://doi.org/10.1049/el:19921332