KIEE International Transactions on Electrophysics and Applications

The Korean Institute of Electrical Engineers (대한전기학회)
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Analysis of the Influence of the Address Electrode Width on High-speed Addressing Using the Vt Close Curve and Dynamic Vdata Margin

  • Kim, Yong-Duk (Dept. of Electrical Engineering, Kyungpook National University) ;
  • Park, Se-Kwang (Dept. of Electrical Engineering, Kyungpook National University)
  • Published : 2005.10.01
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Abstract

In order to drive the high-density plasma displays, a high-speed driving technology must be researched. In this experiment, the relationship between the width of the address electrode and high-speed driving is analyzed using the Vt close curve and the panel structure for high-speed driving is proposed. In addition we show that the wider the width of the address electrode is, the narrower the width of the scan pulse becomes. Therefore, we could achieve the minimum data voltage of 50.1V at a scan pulse width of $1.0/{\mu}s$ and a ramp voltage of 210V at an address electrode width of $180/{\mu}m$ for the high-speed driving 4-inch test PDP.

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References

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