Room-Temperature Deposition of ZnO Thin Film by Pulsed Vacuum Arc and Effect of Oxygen Gas Ratio on Its Electrical Properties

펄스형 진공 아크법에 의한 ZnO 박막의 상온합성 및 이의 전기적 특성에 미치는 산소분압비의 영향

  • Shin Min-Geun (Changwon National University) ;
  • Byon Eungsun (Surface Technology Research Center, Korea Institute of Machinery and Materials) ;
  • Lee Sunghun (Surface Technology Research Center, Korea Institute of Machinery and Materials) ;
  • Kim Do-Geun (Surface Technology Research Center, Korea Institute of Machinery and Materials) ;
  • Jeon Sang-Jo (Department of Shipbuilding, Defense Quality Assurance Agency) ;
  • Koo Bon Heun (Changwon National University)
  • 신민근 (창원대학교 나노 신소재공학부) ;
  • 변응선 (한국기계연구원 표면기술연구센터) ;
  • 이성훈 (한국기계연구원 표면기술연구센터) ;
  • 김도근 (한국기계연구원 표면기술연구센터) ;
  • 전상조 (국방품질관리소 함정분소) ;
  • 구본흔 (창원대학교 나노 신소재공학부)
  • Published : 2005.10.01

Abstract

Highly c-axis oriented Zinc oxide (ZnO) films were successfully deposited at room temperature by oxygen ion-assisted pulsed filtered vacuum arc. The effect of oxygen gas ratio ($O_{2}/O_{2}+Ar$ on the preferred orientation, surface morphology and resistivity of the ZnO films were investigated. Highly crystalline ZnO films with (002) orientation were obtained at over $13\%$ of oxygen gas ratio. Increasing oxygen gas ratio up to $80\%$ was found to improve crystallinity of the films. From hall measurements, it was found that the film has n-type characteristic and carrier concentration and its mobility were closely related with oxygen gas ratio. Minimal resistivity of $3.6{\times}10^{-3}{\Omega}{\cdot}cm$ was obtained in the range of $20\%$ to $40\%$ of oxygen gas ratio.

Keywords

References

  1. T. Minami, S. Ida, T. Miyata, Y. Minamino, Thin Solid Films, 445 (2003) 268 https://doi.org/10.1016/S0040-6090(03)01159-3
  2. K. Matsubara, P. Fans, K. Iwata, A. Yamada, S. Niki, Thin Solid Films, 422 (2002) 176 https://doi.org/10.1016/S0040-6090(02)00965-3
  3. C.-H. Lee, S.-I. Kim, J. Korean Ceramic Soc., 41(2) (2004) 102 https://doi.org/10.4191/KCERS.2004.41.2.102
  4. J. Hinze, K. Ellmer, J. Appl. Phys., 88(5) (2000) 2443 https://doi.org/10.1063/1.1288162
  5. D. R. Clarke, J. Am. Ceram. Soc., 82 (1999) 485 https://doi.org/10.1111/j.1151-2916.1999.tb01793.x
  6. J. H. Choi, H. Tabata, T. Kawai, J. Cryst. Growth, 226 (2001) 493 https://doi.org/10.1016/S0022-0248(01)01388-4
  7. X. L. Xu, S. P. Lau, B. K. Tay, Thin Solid Films, 398-399 (2001) 244 https://doi.org/10.1016/S0040-6090(01)01452-3
  8. J. J. Cuomo, J. Appl. Phys. 70(3) (1991) 1706 https://doi.org/10.1063/1.349540
  9. P. K. Song, Y. Shigesato, I. Yasui, C. W. Ow-Yang, D. C. Paine, Jpn, J. Appl. Phys., 37(4A) (1998) 1870 https://doi.org/10.1143/JJAP.37.1870
  10. K. Y. Tse, H. H. Hng, S. P. Lau, Y. G. Wang, S. F. Yu, Ceramics International, 30 (2004) 1669 https://doi.org/10.1016/j.ceramint.2003.12.156
  11. H. W. Lee, S. P. Lau, Y. G. Wang, K. Y. Tse, H. H. Hng, B. K. Tay, J. Crys. Grow., 268 (2004) 596 https://doi.org/10.1016/j.jcrysgro.2004.04.098
  12. T. David, S. Goldsmith, R. L. Boxman, Thin Solid Films, 61 (2004) 447
  13. H. Nanto, T. Minami, J. Appl. Phys., 55(4) (1983) 1029
  14. R. A. MacGill, M. R. Dickinson, A. Anders, O. R. Monteiro, I. G. Brown, Rev. Sci. Instrum., 69 (1998) 801 https://doi.org/10.1063/1.1148718
  15. 김도윤, 경북대학교 대학원 물리학과 박사학위 논문 (2004)
  16. 김종국, 서울대학교 대학원 원자핵공학과 박사학위 논문 (2000)
  17. A. Anders, G. Y. Yushkov, J. Appl. Phys., 91 (2002) 4824 https://doi.org/10.1063/1.1459619
  18. X. L. Xu, S. P. Lau, J. S. Chen, G. Y. Chen, B. K. Lay, J. Cryst. Growth, 223 (2001) 201 https://doi.org/10.1016/S0022-0248(01)00611-X
  19. H. Takikawa, K. Kimura, R. Miyano, T. Sakakibara, Thin Solid Films, 74 (2000) 377
  20. V. Gupta, A. Mansingh, J. Appl. Phys., 80 (1996) 1063 https://doi.org/10.1063/1.362842
  21. B.-Y. Oh, M-C. Jeong, W. Lee, J-M. Myoung, J. Cryst. Growth, 274 (2005) 453 https://doi.org/10.1016/j.jcrysgro.2004.10.026
  22. Y. G. Wang, S. P. Lau, H. W. Lee, S. F. Yu, B. K. Tay, X. H. Zhang, K. Y. Tse, H. H. Hng, J. Appl. Phys., 94(3) (2003) 1597 https://doi.org/10.1063/1.1592007
  23. E. Ziegler, A. Heirich, H. Oppermann, G. Stover, Phys. Stat. Sol., (a) 66 (1981) 635 https://doi.org/10.1002/pssa.2210660228
  24. H.-C. Lee, O. O. Park, Vacuum, 75 (2004) 275 https://doi.org/10.1016/j.vacuum.2004.03.008