References
- S. Zhou, L. Wu, J. Sun, and W. Shen, Prog. Org. Coat., 45, 33 (2002) https://doi.org/10.1016/S0300-9440(02)00085-1
- P. Hajji, L. David, J. F. Gerard, J. P. Pascault, and G. Vigier, J. Polym. Sci.; B: Polym. Phys., 37, 3172 (1999) https://doi.org/10.1002/(SICI)1099-0488(19991115)37:22<3172::AID-POLB2>3.0.CO;2-R
- W. G. Hahn, H. S. Myoung, and S. S. Im, Macromol. Res., 12, 85 (2004) https://doi.org/10.1007/BF03218999
- S. H. Ahn, S. H. Kim, B. C. Kim, K. B. Shim, and B. G. Cho, Macromol. Res., 12, 293 (2004) https://doi.org/10.1007/BF03218403
- H. Kaddami, J. F. Gerard, P. Hajji, and J. P. Pascault, J. Appl. Polym. Sci., 73, 2701 (1999) https://doi.org/10.1002/(SICI)1097-4628(19990923)73:13<2701::AID-APP18>3.0.CO;2-F
- W. A. R. van Heeswijk, P. H. Vriens, J. J. Vrancken, G. H. M. van Engelen, and C. Roux, Proceedings of RadTech Europe, Maastricht, Netherlands, 1995, p. 430
- C. Vu, C. Faurent, A. Eranian, P. Vincent, and D. Wilhelm, Proceedings of RadTech North America, Baltimore, USA, 2000, p. 822
- C. Vu, O. La Ferte, and A. Eranian, Proceedings of RadTech North America, Indianapolis, USA, 2002, p. 330
- J. D. Cho, E. O. Kim, H. K. Kim, and J. W. Hong, Polym. Test., 21, 781 (2002) https://doi.org/10.1016/S0142-9418(02)00012-0
- J. D. Cho, H. K. Kim, Y. S. Kim, and J. W. Hong, Polym. Test., 22, 633 (2003) https://doi.org/10.1016/S0142-9418(02)00024-7
- J. D. Cho and J. W. Hong, J. Appl. Polym. Sci., 93, 1473 (2004) https://doi.org/10.1002/app.20597
- J. D. Cho and J. W. Hong, Eur. Polym. J., 41, 367 (2005) https://doi.org/10.1016/j.eurpolymj.2004.10.006
- Technical Bulletin Pigments, No. 11, Company publication, Degussa AG
- C. Decker, T. Nguyen Thi Viet, D. Decker, and E. Weber- Koehl, Polymer, 42, 5531 (2001) https://doi.org/10.1016/S0032-3861(01)00065-9