참고문헌
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피인용 문헌
- Microstructural analysis of TRISO particles using multi-scale X-ray computed tomography vol.461, 2015, https://doi.org/10.1016/j.jnucmat.2015.02.034
- Study on Polarization Characteristics of Optical Device and Improvement of Measurement Precision of Normal Incidence Ellipsometer for Measuring Optical Anisotropy of a Micro Spot vol.23, pp.6, 2012, https://doi.org/10.3807/KJOP.2012.23.6.274