Journal of the Korean Data and Information Science Society
- Volume 15 Issue 4
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- Pages.935-943
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- 2004
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- 1598-9402(pISSN)
Optimal M-level Constant Stress Design with K-stress Variables for Weibull Distribution
Abstract
Most of the accelerated life tests deal with tests that use only one accelerating variable and no other explanatory variables. Frequently, however, there is a test to use more than one accelerating or other experimental variables, such as, for examples, a test of capacitors at higher than usual conditions of temperature and voltage, a test of circuit boards at higher than usual conditions of temperature, humidity and voltage. A accelerated life test is extended to M-level stress accelerated life test with k-stress variables. The optimal design for Weibull distribution is studied with k-stress variables.