Nano/Micro-scale friction properties of Silicon and Silicon coated with Chemical Vapor Deposited (CVD) Self-assembled monolayers

  • Yoon, Eui-Sung (Tribology Research Center, Korea Institute of Science and Technology) ;
  • R.Arvind Singh (Tribology Research Center, Korea Institute of Science and Technology) ;
  • Oh, Hyun-Jin (Tribology Research Center, Korea Institute of Science and Technology) ;
  • Han, Hung-Gu (Tribology Research Center, Korea Institute of Science and Technology) ;
  • Kong, Ho-Sung (Tribology Research Center, Korea Institute of Science and Technology)
  • Published : 2004.12.01

Abstract

Abstract : Nano/micro-scale friction properties were investigated on Si (100) and three self-assembled monolayers (SAMs) (PFOTC, DMDM, DPDM) coated on Si-wafer by chemical vapor deposition technique. Experiments were conducted at ambient temperature(24$pm$1$circ$C) and humidity(45$pm$5%). Friction at nano-scale was measured using Atomic Force Microscopy (AFM) in the range of 0-40nN normal loads. In both Si-wafer and SAMs, friction increased linearly as a function of applied normal load. Results showed that friction was affected by the inherent adhesion in Ssi-wafer, and in the case of SAMs the physical/chemical structures had a major influence. Coefficient of friction of these test samples at the micro-scale was also energies. In order to study the effect of contact area on coefficient of friction at the micro-scale, friction was measured for Si-wafer and DPDM against Soda Lime balls (Duke Scientiffic Corporation) of different radii (0.25 mm, 0.5 mm and 1 mm) at different applied normal loads (1500, 3000 and 4800 mN). Results showed that Si-wafer had higher coefficient of friction than DPDM. Further, unlike that in the case of DPDM, friction in Si-wafer was severely influenced by its wear. SEM evidences showed that solid-solid adhesion was the wear mechanism in Si-wafer.

Keywords

References

  1. Ulman, Abraham., 'Formation and Structure of Self-Assembled Monolayers', Chem. Rev. 96, pp.1533-1554, 1996 https://doi.org/10.1021/cr9502357
  2. Linford, M.R, Chidsey, C.E.D., J. Am. Chem. Soc. 115, p. 12631, 1993 https://doi.org/10.1021/ja00079a071
  3. Maboudian, Roya, Roger, Howe, T., 'Critical Review: Adhesion in surface micromechanical structures', J. Vac. Sci. Technol. B 15 (1), pp. 1-20, 1997
  4. Bhushan, Bharat., 'Modern Tribology Handbook', Volume 2, CRC Press, Boca Raton, Florida, 2001
  5. Komvopoulos, K, 'Surface engineering and microtribology for microelectromechanical systems', Wear 200, pp. 305-327, 1996 https://doi.org/10.1016/S0043-1648(96)07328-0
  6. Ashurst, Robert, W, Carraro, C, Maboudian, R, Frey, W, 'Wafer level anti-stiction coatings for MEMS', Sensors and Actuators A 104, pp. 213-221, 2003
  7. Oh, Hyun-Jin, Yoon, Eui-Sung, Han, Hung-Gu, Kong, Hosung., 'Micro/nano adhesion and friction properties of SAMs with different head and functional group according to the coating methods', KSTLE-38th Spring Conference, June 11, Seoul, pp. 177-184, 2004
  8. Bharat Bhushan, Ashok V. Kulkarni., 'Effect of normal load on microscale friction measurements', Thin Solid Films 278, pp 49-56, 1996 https://doi.org/10.1016/0040-6090(95)08138-0
  9. Bhushan, B, Sundararajan, S., 'Micro/Nanoscale Friction and Wear mechanisms of thin films using atomic force and friction force microscopy,' Acta mater. 46 (11), pp.3793-3804, 1998 https://doi.org/10.1016/S1359-6454(98)00062-7
  10. Bhushan, Bharat, Dandavate, Chetan., 'Thin-film friction and adhesion studies using atomic force microscopy'. Journal of Applied Physics 87 (3), pp. 1201-1210, 2000 https://doi.org/10.1063/1.371998
  11. Mastrangelo, C.H.,, Tribol. Lett. 3, pp. 223-238, 1997 https://doi.org/10.1023/A:1019133222401
  12. Kim, Hyun, I, Koini, Thomas, Lee, Randall, T, Perry, Scott, S., 'Systematic Studies of the Frictional Properties of Fluorinated Monolayers with Atomic Force Microscopy: Comparison of CF,and CHrTenninated Films', Langmuir 13, pp. 7192-7196, 1997 https://doi.org/10.1021/la970539j
  13. Bowden, F. P, Tabor, D., 'The friction and lubrication of solids'. Clarendon Press, Oxford, 1950
  14. Johnson, K L. Kendall, K, Roberts, A.D., 'Surface energy and contact of elastic solid', Proceedings of the Royal Society of London A 324, pp. 301-313, 1971
  15. Maboudian, Roya, Ashrust, Robert, W, Carraro, Carlo, 'Tribological challenges in micromechanical systems', Tribol. Lett. 12 (2), pp. 95-100, 2002 https://doi.org/10.1023/A:1014044207344
  16. Geyer, Stadler, W, Eck, V, Zhamikov, M, Golzhauser, A, Grunze, M., 'Electron-induced crosslinking of aromatic self-assembled monolayers: negative resists for nanolithography', Appl. Phys. Lett. 75, pp. 2401-2403, 1999 https://doi.org/10.1063/1.125027
  17. Ovemey, RM, Meyer, E, Frommer, J, Guntherodt, H.J, Fujihira, M, Takano, H, Gotoh, Y, 'Friction measurements on phaseseperated thin films with a modified atomic force microscope', Langmuir 10, p. 1281, 1994 https://doi.org/10.1021/la00016a049
  18. Bhushan, Bharat, Liu, Huiwen., 'Nanotribological properties and mechanisms of alkylthiol and biphenyl thiol self-assembled monolayers studied by AFM', Physical Review B 63, p. 245412, 2001
  19. Kim, Hyun, I, Graupe, Michael, Oloba, Olugbenga, Koini, Thomas, Irnaduddin, Syed, Lee, Randall, T, Perry, Scott, S., 'Molecularly Specific Studies of the Frictional Properties of Monolayer Films: A Systematic Comparison of $CH_3-$, $(CH_3)_2$CH and $CH_3-$Terminated Films', Langmuir 15, pp. 3179-3185, 1999 https://doi.org/10.1021/la981497h
  20. Gardos, M.N., 'Surface chemistry-controlled tribological behaviour of Si and Diamond', Tribology Letters 2, p. 173, 1996 https://doi.org/10.1007/BF00160974