한국정보통신학회논문지 (Journal of the Korea Institute of Information and Communication Engineering)

  • 제8권8호
  • /
  • Pages.1705-1712
  • /
  • 2004
  • /
  • 2234-4772(pISSN)
  • /
  • 2288-4165(eISSN)
한국정보통신학회 (The Korea Institute of Information and Commucation Engineering)
권호 표지

5GHz 저잡음 증폭기의 성능검사를 위한 새로운 고주파 Built-In Self-Test 회로 설계

Design of a New RF Buit-In Self-Test Circuit for Measuring 5GHz Low Noise Amplifier Specifications

  • 류지열 (애리조나주립대학교 전기공학과) ;
  • 노석호 (안동대학교 전자공학과) ;
  • 박세현 (안동대학교 전자공학과)
  • 발행 : 2004.12.01
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⟨ 이전 논문 다음 논문 ⟩

초록

본 논문에서는 5.25GHz 저잡음 증폭기(LNA)에 대해 전압이득, 잡음지수 및 입력 임피던스를 측정할 수 있는 새로운 형태의 저가 고주파 BIST(Built-In Self-Test, 자체내부검사)회로 설계 및 검사 기술을 제안한다. 이러한 BIST 회로는 0.18$\mu\textrm{m}$ SiGe 공정으로 제작되어 있다. 이러한 접근방법은 입력 임피던스 정합과 출력 전압 측정원리를 이용한다. 본 논문에서 제안하는 방법은 측정이 간단하고 비용이 저렴하다는 장점이 있다. BIST 회로가 차지하는 면적은 LNA가 차지하는 전체면적의 약 18%에 불과하다.

This paper presents a new low-cost RF Built-In Self-Test (BIST) circuit for measuring transducer voltage gain, noise figure and input impedance of 5.25GHz low noise amplifier (LNA). The BIST circuit is designed using 0.18${\mu}{\textrm}{m}$ SiGe technology. The test technique utilizes input impedance matching and output transient voltage measurements. The technique is simple and inexpensive. Total chip size has additional area of about 18% for BIST circuit.

키워드

참고문헌

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