참고문헌
- Appl. Phys. Lett. v.51 Organic electroluminescent diodes C.W.Tang;S.A.VanSlyke https://doi.org/10.1063/1.98799
- 전기전자재료학회논문지 v.15 no.12 유기 EL 디스플레이의 개요 재료 및 연구 동향 박준형
- 전기전자재료학회논문지 v.12 no.6 유기박막의 EL Devices 박종운;박수길
- 전기전자재료학회 논문지 v.12 no.6 유기 전기발광 소자의 구조 및 특성 하창식;임현택;정혜인;조원제
- Information Display no.7 OLED Encapsulation Kimberly Allen
- Journal of Luminescence v.87 Organic LED full color passive-matrix display Hirofumi Kubota;Satoshi Miyaguchi;Shinichi Ishizuka;Takeo Wakimoto;Jun Funaki;yoshinori Fukuda;Teruichi Watanabe;Hideo Ochi;Tsuyoshi Sakamoto;Takako Miyake;Masami Tsuchida;Isamu Ohshita;TERuo Tohma https://doi.org/10.1016/S0022-2313(99)00229-X
- Journal of Physics D: Appl. Phys. v.34 K.Yamashita;T.Mori;T.Mizutani https://doi.org/10.1088/0022-3727/34/5/312
- Thin Solid Films v.417 Low moisture permeation measurement through polymer substance for organic light emitting devices R.S.Kumar;Mark Auch;Eric Ou;Guen-ther Ewald;Chua Soo Jin https://doi.org/10.1016/S0040-6090(02)00584-9
- Journal of applied Polymer Science v.82 Permeation of Oxygen and Water Vapor through EVOH films aqs Influenced by Relative Humidity Zhonghin Zhang;lan J. Britt;Marvin A. Tung https://doi.org/10.1002/app.2030
- Thin Solid Films v.355;356 A microstructural study of transparent metal oxide gas barrier films B.M.Henry;F.Y.Zhao;C.R.M.Grovenor;O.V.Kolosov;G.A.D.Briggs;A.P.Roberts;R.S.Kumar;R.P.Howson
- Surface and Coating Technology v.166 Silicon oxide gas barrier films deposited by reactive sputtering Satoru Iwanori;Tumi gotoh;Krzysztof Moorhi https://doi.org/10.1016/S0257-8972(02)00769-7
- Thin Solid Films v.388 Characterisation of aluminum oxynitride gas barrier films A.G.ERlat;B.M.Henry;J.J.Ingram;D.B.Mountain;A.McGuigan;R.P.Howson;C.R.M.Grovenor;G.A.D.Briggs;Y.Tsukahara https://doi.org/10.1016/S0040-6090(01)00836-7
- Analytica chimica Acta v.262 no.Issue 2 Determination of thin metal film thickness by x-ray diffractometry using the Scherrer equation, atomic absorption analysis and transmission/reflection visible spectroscopy Alfred T DAgostmo https://doi.org/10.1016/0003-2670(92)80064-E
피인용 문헌
- Process Characteristics of SiOxand SiOxNyFilms on a Gas Barrier Layer using Facing Target Sputtering (FTS) System vol.22, pp.12, 2009, https://doi.org/10.4313/JKEM.2009.22.12.1028
- Out Gassing from Plastic Substrates Affect on the Electrical Properties of TCO Films vol.22, pp.11, 2009, https://doi.org/10.4313/JKEM.2009.22.11.961