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사파이어 웨이퍼의 기계-화학적인 연마 가공특성에 관한 연구

Chemo-Mechanical Polishing Process of Sapphire Wafers for GaN Semiconductor Thin Film Growth

  • 발행 : 2004.01.01

초록

The sapphire wafers for blue light emitting devices were manufactured by the implementation of the surface machining technology based on micro-tribology. This process has been performed by chemical and mechanical polishing process. The sapphire crystalline wafers were characterized by double crystal X-ray diffraction. The sample quality of sapphire crystalline wafer at surfaces has a full width at half maximum of 89 arcsec. The surfaces of sapphire wafer were mechanically affected by residual stress during the polishing process. The wave pattern of optical interference of sapphire wafer implies higher abrasion rate in the edge of the wafer than its center from the Newton's ring.

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참고문헌

  1. Kim, K. and Koh, J. C., 2000, 'GaN epitaxial growths on chemically and mechanically polished sapphire wafers grown by Bridgeman method,' Journal of the Korea Association of Crystal Growth Vol. 10, No. 5, p. 350
  2. Kim, J. D. and Heo, G. W., 2000, 'Polishing of ultra-clean internal surface using magnetic force,' Trans. of the KSME A, Vol. 24, No. 11, pp. 2786-2795
  3. Singger, P. H., 1992(Mar.), Semiconductor International, p. 44
  4. O'mara, W. C., 1994(Jul.), Semiconductor International, p. 140
  5. Sung-Hwan Cho, Hyoung-Jae Kim, Ho-Youn Kim, Heon-Deok Seo, Kyoung-Jun Kim and Hae-Do Jeong, 2001, 'Study on the Improvement of the Slurry Dispersibility in CMP,' Trans. of the KSME A, Vol. 25, No. 10, pp. 1535-1540
  6. Sung-Hwan Cho, Hyoung-Jae Kim, Kyoung-Jun Kim and Hae-Do Jeong, 2002, 'The Study on the CMP of Transparent Conductive ITO Thin Films for the Organic Electro-Luminescence Display,' Trans. of the KSME A, Vol. 26, No. 5, pp. 975-985 https://doi.org/10.3795/KSME-A.2002.26.5.976
  7. Pennington, S. and Luce, S., 1992, VMIC Conference, pp. 168-172
  8. Jung, H. D., 1996, 'Ultra Precision Machining Technology for ULSI Chip Fabrication,' Journal of the Korea Society of Mechanical Engineers, Vol. 36 No. 3, pp. 221-230
  9. Jung, H. I., 2000 'Effects of Film Type on CMP Characteristics,' A master's thesis of Hanyang University
  10. Preston, F. W., 1927, 'The Theory and Design of Plate Glass Polishing Machines,' Journal Society of Glass Tech., pp. 214-256
  11. Cook, L. M., 1990, J. Non-cryst. solids, Vol. 120, p. 152 https://doi.org/10.1016/0022-3093(90)90200-6
  12. Lin, C.-W., Dai, B.-T. and Yeb, C.-F., 1995, Journal of Electrochemical Society, Vol. 142, No. 9, p. 3098 https://doi.org/10.1149/1.2048695
  13. Sivaram, S., et al., 1992, Proc. of Workshop on ULSI Metallization, MRS
  14. Miller, J. F., Lai W. Y-C. and Hoffman, M., 1995, Proc. IEEE VLSI Multilevel interconnection conf. p. 476
  15. Papoulis, A., 1965, 'Probability, Random Variables and Stochastic Processes,' McGraw-Hill, New York
  16. Gutsche, H. W. and Moody, J. W., 1978, 'Polishing of sapphire with colloidal silica,' J. Electrochem. Soc. Vol. 125, p. 136 https://doi.org/10.1149/1.2131378
  17. Kim, K. and Park, C. B., 1998, 'The Effect of Geometrical Misfit Dislocation on Formation of Microstructure and Photoluminescence of Wurtzite $GaN/Al_2O_3$(0001) Films Grown by Low Pressure Metal-Organic Chemical Vapor Deposition,' Thin Solid Films, Vol. 330, p. 139 https://doi.org/10.1016/S0040-6090(98)00541-0