Journal of the Semiconductor & Display Technology (반도체디스플레이기술학회지)
- Volume 2 Issue 4
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- Pages.13-17
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- 2003
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- 1738-2270(pISSN)
Measurement Technology of Chamber Impedance for RF Matching
RF 정합 특성 개선을 위한 챔버의 임피던스 측정법
Abstract
An adaptor is designed for chamber impedance measurement of plasma process. Copper rod, fixed board and compensation circuit are the major components of the adaptor. An adaptor can be to measure chamber impedance on time unless stopping a process and Data to measure can do the database. We can use it to a criteria data for a failure diagnosis. So developed adaptor could be used for diagnosis the plasma process chamber in semiconductor industry.