Transactions on Electrical and Electronic Materials

  • 제4권6호
  • /
  • Pages.1-4
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  • 2003
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  • 1229-7607(pISSN)
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  • 2092-7592(eISSN)
한국전기전자재료학회 (The Korean Institute of Electrical and Electronic Material Engineers)
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Anti-Reflection Properties of In-Situ Doped Spin-On Film

  • U. Gangopadhyay (School of Electrical and Computer, Engineering, Sungkyunkwan University) ;
  • Kim, Kyung-Hae (School of Electrical and Computer, Engineering, Sungkyunkwan University) ;
  • Park, J.H. (School of Electrical and Computer, Engineering, Sungkyunkwan University) ;
  • S.K. Dhungel (School of Electrical and Computer, Engineering, Sungkyunkwan University) ;
  • D. Mangalaraj (School of Electrical and Computer, Engineering, Sungkyunkwan University) ;
  • J. Yi (School of Electrical and Computer, Engineering, Sungkyunkwan University) ;
  • H. Saha (Department of Electronics and Tele-communication Engineering, Jadavpur University) ;
  • Kim, D.W. (Samsung SDI Co. Ltd., Corporate R&D Center, Yongin City)
  • 발행 : 2003.12.01
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초록

Anti-reflection properties of post diffusion doped spin-on source (in-situ AR coating) have been investigated in some detail. A simple experiment for reflectivity study using oblique incidence of light and necessary modification of the theory of minimum reflectivity at oblique incidence has been established. The comparative study of the in-situ AR coating with available spin-on AR film on silicon Solar Cell Surface have been investigated.

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참고문헌

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