Korean Journal of Materials Research (한국재료학회지)

Materials Research Society of Korea (한국재료학회)
권호 표지
DOI QR코드

DOI QR Code

Luminescence in SrCl2:Eu2+,Na+ X-ray Storage Phosphor

SrCl2:Eu2+,Na+ X-선 영상저장 형광체의 발광특성

  • Kim, Sung-Hwan (Department of Physics, Kyungpook National University) ;
  • Kim, Wan (Department of Physics, Kyungpook National University) ;
  • Kang, Hee-Dong (Department of Physics, Kyungpook National University) ;
  • Doh, Sih-Hong (Department of Physics, Pukyong National University) ;
  • Seo, Hyo-Jin (Department of Physics, Pukyong National University) ;
  • Kim, Young-Kook (Division of Applied Mathematics and Physics, Kyungnam University) ;
  • Kim, Do-Sung (Division of Science Education, Daegu University)
  • Published : 2003.06.01
Download PDF
⟨ Previous Next ⟩

Abstract

Photoluminescence(PL), photostimulated luminescence(PSL) and thermoluminescence(TL) in $SrC1_2$:$Eu^{2+}$ , $Na^{+}$ phosphor powder were measured, and the activation energies(trap depth) of traps associated with TL and PSL were investigated. The PL and PSL in the studied sample is due to the $4f^{6}$ 5d\longrightarrow$4f^{7}$transition of $Eu^{ 2+}$. TL glow curve is single peak, and its peak temperature is about 377.2 K. The PL, PSL and TL emission spectra of the phosphors are located in the range of 380∼440 nm, peaking at 408 nm. The activation energy of the PSL trapping center is 0.78 eV and that of the TL trapping center is 0.79 eV. We, thus, suggest that the trapping centers giving rise to the PSL are identical to those giving rise to the TL.

Keywords

References

  1. S. S. Shastry, R. C. Bhatt and K. G. Vohra, Radiat. Prot. Dosim., 6(1/4), 335 (1983) https://doi.org/10.1093/oxfordjournals.rpd.a082943
  2. L. L. Campos and O. O. Fernandes Filho, Radiat. Prot. Dosim., 33(1/4), 111 (1990) https://doi.org/10.1093/oxfordjournals.rpd.a080769
  3. M. Sonoda, M. Takano, J. Miyahara and H. Kato, Raiology, 148, 833 (1983)
  4. M. Thoms and von Seggern, J. Appl. Phys., 81(9), 5887 (1997) https://doi.org/10.1063/1.364375
  5. S. Ichihara, S. Hayakawa, S. Saga, M. Hoshino, S. Sakuma, M. Ikeda, H. Yamaguchi, T. Hanaichi and Y. Kamiya, J. Electron Microsco, 33(3), 255 (1984)
  6. H. Nanto, M. Miyazaki, A. Imai, H. Komori, Y. Douguchi, E. Kusano and A. Kinabara, IEEE Trans. Nucl. Sci., 47(4), 1620 (2000) https://doi.org/10.1109/23.873025
  7. H. Nanto, K. Murayama, T. Usuda, S. Tanigdchi and N. Takeuchi. Radiat. Prot. Dosim. 47, 281 (1993) https://doi.org/10.1093/oxfordjournals.rpd.a081751
  8. H. Von Seggern, A. Meijerink, J. Voigt. and A. Winnacker. J. Appl. Phys., 66, 4418 (1989) https://doi.org/10.1063/1.343936
  9. U. Rogulis, C. Dietze, Th. Pawlik, Th. Hangleiter and J.M. Spaeth, J. App. Phys., 80(4), 2430 (1996) https://doi.org/10.1063/1.363078
  10. L. D. Merkle and P. K. Bandyopadhyay, Phys. Rev. B, 39(10), 6939 (1989) https://doi.org/10.1103/PhysRevB.39.6939
  11. W. Kong, S. Ahmed, J. Ferguson and R. Solanki, Appl. Phys. Lett., 67(1), 7 (1995) https://doi.org/10.1063/1.115514
  12. V. Tabakova, J. Lumin., 68, 265 (1996) https://doi.org/10.1016/0022-2313(96)00002-6
  13. S. P. Keller, J. E. Mapes and G. Cheroff, Phys. Rev., 108(3), 663 (1953) https://doi.org/10.1103/PhysRev.108.663
  14. Y. Douguchi, T. Sato, M. Miyazaki, A. Imai, E. Kusano, A. Kinbara, S. Nasu and H. Nanto, in Proceedings of SPIE Advanced Sensors and Monitors for Process Industries and the Environment(1998), p. 286
  15. H. Nanto, H. Komori, K. Araki, Y. Douguchi, E. Kusano, S. Nasu and K. Kinbara, in Proceedings of SPIE Rare-Earth-Doped Materials and Devices V(2001), p. 248
  16. M. J. Knitel, P. Dorenbos, C. M. Combes, J. Andriessen and C. W. E. van Eijk, J. Lumin., 69, 325 (1996) https://doi.org/10.1016/S0022-2313(96)00112-3
  17. K. Takahashi, J. Miyahara and Y. Shibahara, J. Electrochem. Soc., 132, 1492 (1985) https://doi.org/10.1149/1.2114149
  18. T. Hangleiter, J. Phys: Condens. Matter, 2, 6837 (1990) https://doi.org/10.1088/0953-8984/2/32/013
  19. T. Kimura, S. Nakamura, N. Itoh and K. Inabe, Phys. Stat. Sol.(a), 165, 503 (1998) https://doi.org/10.1002/(SICI)1521-396X(199802)165:2<503::AID-PSSA503>3.0.CO;2-7
  20. V. X. Quang, N. M. Son, P. T. Yen, T. H. Mai, B. Hut시, U. Troppenz and R. H. Mauch, Phys. Stat. Sol.(a) 156, 209 (1996) https://doi.org/10.1002/pssa.2211560125
  21. S. H. Kim, C. J. Kim, W. Kim, H. D. Kang, D. S. Kim, Y. K. Kim, H. J. Seo and S. H. Doh, Sae Mulli(The Korean Physical Society), 45(3), 184 (2002)
  22. K. Takahasi, K. Kohda, J. Muyahara, Y. Kanemitsu, K. Amitani and S. Shionoya, J. Lumin., 31/32, 266 (1984) https://doi.org/10.1016/0022-2313(84)90268-0
  23. G. C. Tayler and E. Lilley, J. Phys. D : Appl. Phys. 11, 567 (1978) https://doi.org/10.1088/0022-3727/11/4/020
  24. R. Chen and A. A. winer, J. Appl. Phys., 41(13), 5227 (1970) https://doi.org/10.1063/1.1658652