References
- Y.K. Ryu and H.S. Cho, 'Visual inspection scheme for use in optical solder joint inspection sustem', IEEE ICRA '96, Minnesota, USA, 1996 https://doi.org/10.1109/ROBOT.1996.509209
- S. M. Rooks, B. Benabib, and K. C. Smith, 'Development of an inspection process for ball-grid-array' tech A. E. M. Bocage, French Patent, No.536464(1992)
- Y. J. Lee, 'Engineering inspection of radioactive rays', Gold Press, 1994, pp 67-132
- S. Black, D. L. Millard, and K. Nilson, 'An animated interface for X-ray laminographic inspection of finepirch interconnect', IEMT Symposium 1991, pp. 207-211 https://doi.org/10.1109/IEMT.1991.279778
- H. Doi, Y. Suzuki, and Y. Hara, 'Real-time X-ray inspection of 3-D defects in circuit board parrems', Fifth international conference on computer vision(ICCV'95), pp 575-582 June, 1995 https://doi.org/10.1109/ICCV.1995.466887
- S. Rooks and T. Sack, 'X-ray inspection of flip chip attach using digital tomosynthesis', Surface Mount international conference(San Jose) 51-55, 1994
- J. Adams, 'X-ray Iaminography analysis of ultra fine pitch soldet connections on ultra-thin boards', Integrated Circuit Metrology,Inspection, and Process Control V (SPIE) Vol.1464. 1991, pp 484-497 https://doi.org/10.1117/12.44460
- T. A. Siewert and M. W. Austin, 'Evaluation and qualification standards for an X-ray Iaminography system', Materials Evaluation, Sept. 1992, pp 1027-1035
- Y.,J. Roh, H.S. Cho, 'The design and analysis of X-ray imaging system using digital tomosynthesis', KAIST,M.S. thesis, 1997
- F. Protes and M. Chausse, French Patent 541941 (1992)
- E. F. Kaelble, Handbook of C-rays, McGraw Hill, New York pp 1-31
- T. D. Kampp, 'The backprojection method applied to classical tomography', Med. Phys. Vol. 13, NO. 3, pp 329-333, 1986 https://doi.org/10.1118/1.595873