참고문헌
- K. Y. Cheng, E. M. Stellini, P. J. Pearah, A. C. Chen, A. M. Moy, and K. C. Hsieh, International Electron Device Meeting '92(IEEE), 875 (1992). https://doi.org/10.1109/IEDM.1992.307496
- P. J. Pearah, E. M. Stellini, A. C. Chen, A. M. Moy, K. C. Hsieh, and K. Y. Cheng, Appl. Phys. Lett. 62, 729 (1993). https://doi.org/10.1063/1.108852
- M. Walther, E. Kapon, C. Caneau, D. M. Hwang, and L. M. Schiavone, Appl. Phys. Lett. 62, 2170 (1993). https://doi.org/10.1063/1.109458
- T. Yamauchi, T. Takahashi, and Y. Arakawa, Surface Science 267, 291 (1992). https://doi.org/10.1016/0039-6028(92)91140-7
- J. C. Yi, N. Dagli, and L. A. Coldren, Appl. Phys. Lett. 59, 3015 (1991). https://doi.org/10.1063/1.105802
- M. S. Miller, H. Weman, C. E. Pryor, M. Krishnamurthy, P. M. Petroff, H. Kroemer, and J. L. Merz, Phys. Rev. Lett. 68, 3464 (1992). https://doi.org/10.1103/PhysRevLett.68.3464
- R. C. Miller, D. A. Kleinman, and A. C. Gossard, Phys. Rev. B 29, 7085 (1984). https://doi.org/10.1103/PhysRevB.29.7085
- G. E. Pikus and G. L. Bir, Sov. Phys.-Solid State 1, 1502 (1960).
- G. E. Pikus and G. L. Bir, Symmetry and straininduced effects in semiconductors, (Wiley, New York ,1974) Chapter 3.
- J. M. Luttinger and W. Kohn, Phys. Rev. 97, 869 (1955). https://doi.org/10.1103/PhysRev.97.869
- J. C. Yi and N. Dagli, IEEE J. Quantum Electron. 31, 208 (1995). https://doi.org/10.1109/3.348047
- I. Suemune and L. A. Colderen, IEEE J. Quantum Electron. 24, 1778 (1988). https://doi.org/10.1109/3.7107
- S. L. Chuang, Physics of Optoelectronic Devices, (Wiley Inter Science, New York, USA, 1995) Chapter 4.
- D. Ahn and S. L. Chuang, IEEE J. Quantum Electron. 24, 2400 (1988). https://doi.org/10.1109/3.14369
- T. P. Bahder, Phys. Rev. B 41, 11992 (1990). https://doi.org/10.1103/PhysRevB.41.11992
- Landolt-Bornstein, Numerical Data and Functional Relationships in Science and Technology, (Springer, Berlin, 1982), vols. 17 and 22a.
- I-H. Tan, M. Y. He, J. C. Yi, E. Hu, N. Dagli, and A. Evans, J. Appl. Phys. 72, 546 (1992). https://doi.org/10.1063/1.351886
- C. Y. P. Chao and S. L. Chuang, Phys. Rev. B 46, 4110 (1992). https://doi.org/10.1103/PhysRevB.46.4110
- S. W. Corzine, private communications
- E. O. Kane, Phys. Rev. 178, 1368 (1965). https://doi.org/10.1103/PhysRev.178.1368
- G. Ji, D. Huang, U. K. Reddy, T. S. Henderson, R. Houdre, and H. Morkoc, J. Appl. Phys. 62, 3366 (1987). https://doi.org/10.1063/1.339299
- S. L. Chuang and C. Y. P. Chao, Phys. Rev. B 43, 9649 (1991). https://doi.org/10.1103/PhysRevB.43.9649
- O. C. Zienkiewicz, Developments in stress analysis, (Applied Science Pub. Ltd., London, 1979) Chapter 1.
- Z. Xu and P. M. Petroff, J. Appl. Phys. 69, 6564 (1991). https://doi.org/10.1063/1.348867
- S. F. Borg, Fundamentals of engineering elasticity, (D. Van Nostrand Co. Ltd., New York, 1962) Chapters 3-4.
- K.-J. Bathe and E. L. Wilson, Numerical Methods in Finite Element Analysis, (Prentice-Hall, Inc., Englewood Cliffs, New Jersey 1976) Chapter 6.
- P. P. Silvester and R. L. Ferrari, Finite Elements For Electrical Engineers, (Cambridge University Press, London 1983) Chapter 1.
피인용 문헌
- 10.3807/KJOP.2005.16.6.542 vol.1, 2015, https://doi.org/10.3807/KJOP.2005.16.6.542