Journal of the Microelectronics and Packaging Society (마이크로전자및패키징학회지)
- Volume 9 Issue 4
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- Pages.31-34
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- 2002
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- 1226-9360(pISSN)
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- 2287-7525(eISSN)
Investigation of Adhesion Mechanism at the Metal-Organic Interface Modified by Plasma Part I
- Sun, Yong-Bin (Graduate School of Industrial Technology and Information, Kyonggi University)
- Published : 2002.12.01
Abstract
For the mold die sticking mechanism, the major explanation is that the silica as a filler in EMC (epoxy molding compound) wears die surface to be roughened, which results in increase of adhesion strength. As the sticking behavior, however, showed strong dependency on the EMC models based on the experimental results from different semiconductor manufacturers, chemisorption or acid-base interaction is apt to be also functioning as major mechanisms. In this investigation, the plasma source ion implantation (PSII) using