References
- Prem Chand JAIN and G.C.TRIGUNAYAT, J. Crystal Growth, 48, 107 (1980) https://doi.org/10.1016/0022-0248(80)90199-2
- U.P. TYAGI and G.C. TRIGUNAYAT, Acta Cryst., C44, 1157 (1988)
- G.C. Trigunayat, Pure App. Phys., 19, 881 (1981)
- S. Roth and M.R. Willig, Appl. Phys. Lett., 18, 328 (1971) https://doi.org/10.1063/1.1653682
- A.E. Dugan and H.K. Hennisch, J. Phys. Rev., 171, 1047 (1968) https://doi.org/10.1103/PhysRev.171.1047
- J. Shooman, Solid State Commun., 13, 673 (1973) https://doi.org/10.1016/0038-1098(73)90456-0
- T. Minagawa, Acta Cryst., A31, 823 (1975)
- F. ADDUCI, L. BALDASSARRE, G. MAGGIPINTO, A. MINAFRA, and F. LEVY, phys. stat. sol.(a), 52, K173 (1979) https://doi.org/10.1002/pssa.2210520260
- J.P. ielinger, B. ohoryles, J. Appl. Phys., 57(2), 15 (1985) https://doi.org/10.1063/1.334803
- M.Y. Khilji, W.F. Sherman and G.R. Wilkinson, J. Raman Spectroscopy, 13, 127 (1982) https://doi.org/10.1002/jrs.1250130206
- R. KLEIM and F. RAGA, J. Phys. Chem. Solids, 30, 2213 (1969) https://doi.org/10.1016/0022-3697(69)90146-2
- F. Levy, A. Mercier and J.P. Voitchovsky, Solid State Commun., 15, 819 (1974) https://doi.org/10.1016/0038-1098(74)90671-1
- M.S. Skoinick and D. Bimberg, Phys. Rev. B, 18, 7080 (1978) https://doi.org/10.1103/PhysRevB.18.7080
- Satoshi Yamazaki and Takenari Goto, J. Phys. Soc. Jpn., 51(10), 3228 (1982) https://doi.org/10.1143/JPSJ.51.3228
- Y. Nagamune, S. Takeyama, N. Miura, T. Minagawa and A. Misu, Appl. Phys. Lett., 50(19), 1337 (1987) https://doi.org/10.1063/1.97899
- S.Takeyama, K.Watanabe, M.Ichihara, K.Suzuki, and Miura, J. Appl. Phys., 68(6), 2735 (1990) https://doi.org/10.1063/1.346449
- Hideyuki Nakagawa, Takanobu Yamasa, Hiroaki Matsumoto and Tetsusuk Hayashi, J. Phys. Soc. Japan, 56(3), 1185 (1987) https://doi.org/10.1143/JPSJ.56.1185
- George H. Stout and Lyle H. Jensen, X-ray Structure Determination A Particle Guide,The Macmillan Commpany, London, p. 386 (1978)
- J.I. Pankove, Optical Processes in Semiconductors, Dover Pub. Inc., New York, Chap. 3 (1971)