참고문헌
- K. Fukunaga, Introduction to Statistical Pattern Recognition, New York : Academic Press, 1972
- K. Fukunaga and T. F. Krile, 'Calculation of Bayes' recognition error for two multivariate Gaussian distributions,' IEEE Trans. Comp., vol. 18, no. 3, pp. 220-229,1969 https://doi.org/10.1109/T-C.1969.222635
- D. Hand, 'Recent advances in error rate estimation,' Pattern Recognition Lett., vol. 4, pp. 335-346, 1968 https://doi.org/10.1016/0167-8655(86)90054-1
- K. Fukunaga and D. Kessell, 'Estimation of classification error,' IEEE Trans. Comp., vol. 20, no. 12, pp. 1521-1527, 1971 https://doi.org/10.1109/T-C.1971.223165
- K. Fukunaga and D. Hummels, 'Leave-one-out procedures for nonparametric error estimates,' IEEE Trans. Pattern Anal. & Machine Intelli., vol. 11, no. 4, pp. 421-423, 1989 https://doi.org/10.1109/34.19039
- L. Buturovic, 'Towards Bayes-optimal linear dimension reduction,' IEEE Trans. Pattern Anal. & Machine Intelli., vol. 16, pp. 420-424, 1994 https://doi.org/10.1109/34.277596
- R. P. Heydorn, 'An upper bound estimate on classification error,' IEEE Trans. Inform. Theory, vol. 14, pp. 783-784, 1968 https://doi.org/10.1109/TIT.1968.1054198
- G. Lugosi and M. Pawlak, 'On the posterior-probability estimate of the error rate of nonparametric classification rules,' IEEE Trans. Inform. Theory, vol. 40, no. 2, 1994 https://doi.org/10.1109/18.312167
- R. Lotlikar and R. Kothari, 'Adaptive linear dimensionality reduction for classification,' Pattern Recognition, vol. 33, pp. 185-194, 2000 https://doi.org/10.1016/S0031-3203(99)00053-9
- K. Tumer and J. Ghosh, 'Estimating the Bayes error rate through classifier combining,' ICPR'96, vol. 2, pp. 695-699, 1996 https://doi.org/10.1109/ICPR.1996.546912
- K. Tumer and J. Ghosh, 'Analysis of decision boundaries in linearly combined neural classi-fiers,' Pattern Recognition, vol. 29, no. 2, pp. 341-348, 1996 https://doi.org/10.1016/0031-3203(95)00085-2
- S. Raudys and V. Pikelis, 'On dimensionality, sample size, classification error, and complexity of classification algorithm in pattern recognition, ' IEEE Trans. Pattern Anal. & Machine Intelli., vol. 2, no. 3, 1980
- H. Schulerud, 'Bias of error in linear discriminant analysis caused by feature selec-tion and sample size,' ICPR 2000, vol. 2, pp. 372-377, 2000 https://doi.org/10.1109/ICPR.2000.906090
- L. Devroye, 'Any discrimination rule can have an arbitrarily bad probability of error for finite sample size,' IEEE Trans. Pattern Anal. & Machine Intelli., vol. 4, pp. 154 -157, 1982 https://doi.org/10.1109/TPAMI.1982.4767222
- A. Antos, L. Devroye and L. Gyorfi, 'Lower bounds for Bayes error estimation,' IEEE Trans. Pattern Anal. & Machine Intelli., vol. 21, no. 7, pp. 643-645, 1999 https://doi.org/10.1109/34.777375
- C. Lee and E. Choi, 'Bayes error evaluation of the Gaussian ML classifier,' IEEE Trans. Geos. Remote Sensing, vol. 38, no. 3, pp. 1471-1475, 2000 https://doi.org/10.1109/36.843045
- T. Kaliath, 'The divergence and Bhattacharyya distance measures in signal selection,' IEEE Trans. Commun. Technol., vol. 15, pp. 52-60, 1967 https://doi.org/10.1109/TCOM.1967.1089532
- J. A, Richards, Remote Sensing Digital Image Analysis, Springer-Verlag, 1993
- R. O. Duda and P. E. Hart, Pattern Classifi-cation and Scene Analysis, John Wiley and Sons, New York, NY, 1973
- T. Taxt, N. L. Hjort and L. Eikvil, 'Statistical classification using a linear mixture of two multinormal probability densities,' Pattern Recognition Letters, vol. 12, pp. 731-737, 1991 https://doi.org/10.1016/0167-8655(91)90070-3
- M. Sadiku and R. Kiem, 'Newton-Cotes rules for triple integral,' IEEE Proceedings. Sou-theastcon '90, vol. 2, pp. 471-475, 1990 https://doi.org/10.1109/SECON.1990.117858
- W. H. Press and et al., Numerical Recipies in C, 2nd ed. pp. 161-164, Cambridge Press, NY, 1992
- L. L. Biel and et al., 'A Crops and Soils Data Base For Scene Radiation Research,' Proc. Machine Process. of Remotely Sensed Data Symp., West Lafayette, Indiana, 1982