SOC 테스트 기술 동향

  • 강성호 (연세대학교 전기전자공학과) ;
  • 송동섭 (연세대학교 전기전자공학과)
  • 발행 : 2002.01.01

초록

키워드

참고문헌

  1. IEEE Design & Test of Computers Introducing Core-Based System Design R.K. Gupta;Y. Zorian
  2. IEEE International Test Conference Towards a Standard for Embedded Core Test : An Example E.J. Marinissen;Y. Zorian;R. Kapur;T. Taylor;L. Whetsel
  3. IEEE P1500 Web Site
  4. IEEE Standard Test Access Port and Boundary-Scan Architecture-IEEE Std. 1149.1-1990. IEEE IEEE Computer Society
  5. IEEE International Test Conference A Structured Test Re-Use Methodology for Core-Based System Chips P. Varma;S. Bhatia
  6. IEEE International Test Conference A Structured And Scalable Mechanism for Test Access to Embedded Reusable Cores E.J. Marinissen
  7. IEEE International Test Conference On Using IEEE P150 SECT for Test Plug-n-Play E.J. Marinissen;R. Kapur;Y. Zorian
  8. Proc. of Design Automation Conference System-Chip Test Strategies Y. Zorian