참고문헌
- O plus E v.22 no.12 Photonic-Network 의 전망과 금후의 기술과제 청산우기 등
- 측정표준 v.24 no.3 광통신과 파장표준 서호성;문한섭
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NIST Special Publication
Standard reference materials: acetylene
$^{12}C_2H_2$ absorption reference for 1510-1540 nm wavelength calibration-SRM 2517 S. L. Gilbert;W. C. Swann -
Opt. Lett.
v.19
no.11
Ultranarrow
$^{13}C_2H_2$ saturatied-absorption lines at 1.5㎛ M. de Labachelerie;K. Nakagawa;M. Ohtsu https://doi.org/10.1364/OL.19.000840 - J. J. Appl. Phys. v.29 no.3 Wavelength measurement of the 1.5-㎛ band of acetylene by semiconductor laser S. Kinugawa;H. Sasada https://doi.org/10.1143/JJAP.29.611
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Opt. Lett.
v.19
no.22
$C_2HD$ and$^{13}C_2H_2$ absorption lines near 1530 nm for semiconductor-laser freqeuency locking C. Latrasse;M. Breton;M. Tetu;N. Cyr;R. Roberge;B. Villeneuve https://doi.org/10.1364/OL.19.001885 -
NIST Special Publication
Standard reference materials: hydrogen cyanide
$H^{13}C^{14}N$ absorption reference for 1530-1560 nm wavelength calibration-SRM2519 S. L. Gilbert;W. C. Swann;C. M. Wang -
Opt. Lett.
v.20
no.19
Optical frequency measurement of the
$H^{12}C^{14}N$ Lamb-dip-stabilized$1.5-{\mu}m$ diode laser Y. Awaji;K. Nakagawa;M. de Labachelerie;M. Ohtsu;H. Sasada https://doi.org/10.1364/OL.20.002024 - J. Opt. Soc. Am. B v.13 no.12 Accurate optical frequency atlas of the 1.5-μm bands of acetylene K. Nakagawa;M. de Labachelerie;Y. Awaji;M. Kourogi https://doi.org/10.1364/JOSAB.13.002708
- Opt. Comm. v.142 Saturation spectroscopy of an acetylene molecule in the 1550 nm region using am erbium doped fiber amplifier A. Onae;K. Okumura;Y. Miki;T. Kurosawa;E. Sakuma;J. Yoda;K. Nakagawa https://doi.org/10.1016/S0030-4018(97)00308-8
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광학회지
v.8
no.1
아세칠렌가스(
$^{13}C_2H_2$ )분자의 흡수선을 이용한 기준 광신호 및 광섬유 파브리-페로 필터에 의한 등간격 다중채널의 안정화 이현재;류갑열;이동호;박창수 -
Metrologia
v.37
no.2
International comparisons of He-Ne lasers stabilized with
$^{127}I_2$ at${\lambda}=633\;nm$ (July 1993 to September 1995) - part V : comparison of asian-pacific and south african lasers at${\lambda}=633\;nm$ N. Brown;E. Jaatinen;H. Suh;E. Howick;G. Xu;I. Veldman;A. Chartier;J.-M. Chartier https://doi.org/10.1088/0026-1394/37/2/2