$Nb/A1O_x/Nb$ 조셉슨 접합에서 저항측정을 이용한 Nb 전극의 침투깊이 측정

Determination of Penetration Depth of Nb Electrodes in $Nb/A1O_x/Nb$ Josephson Junction by Resistive Method

  • 김동호 (영남대 이과대학 자연과학부) ;
  • 김규태 (한국표준과학연구원 책임연구원) ;
  • 박종원 (영남대 대학원 물리학과) ;
  • 황준석 (영남대 대학원 물리학과) ;
  • 홍현권 (한국표준과학연구원)
  • 발행 : 2002.05.01

초록

Penetration depth of Nb electrodes in $Nb/A1O_x/Nb$ Josephson junctions has been measured by resistive method. For a given applied field, the total flux through the junction is temperature dependent because the penetration depth of Nb electrode varies with temperature. If the total flux equals an integral multiple of the flux quantum at certain temperatures, resistive peaks appear at those temperatures. The penetration depth of Nb can be determined by applying the above condition, The temperature dependence of penetration depth was found to be well described by the two-fluid model.

키워드

참고문헌

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