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Analysis of Electroluminescent Device Using Fractal Theory

프랙탈 이론을 이용한 발광소자 발광특성 분석

  • 조재철 (초당대학교 전자공학과) ;
  • 박계춘 (목포대학교 전기공학과) ;
  • 홍경진 (광주대학교 컴퓨터전자통신공학부)
  • Published : 2002.04.01

Abstract

The applicability of models based on fractal geometry to characterize the surface of the EL devices was investigated. Insulating layer and phosphor layer of EL devices were deposited on ITO glass using e-beam method. The images of phosphor layer by scanning electron microscope(SEM) were transformed to binary coded data. The relations between fractal geometry and electrical characteristics of EL devices were investigated. When the fractal dimension of $Cas:EuF_3$ EL device was 1.82 and its grain boundary area was 19%, the brightness of $Cas:EuF_3$ EL device was 261 cd/$\textrm{m}^2$.

Keywords

References

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