References
- D.B. Newell, J.R. Pratt, J.A. Kramar, D.T. Smith, L.A. Feeney and E.R. Williams, 'Si Traceability of Force at the Nano Newton Level,' 2001 NCSL International Workshop & Symposium, 2001
- W. Hoffmann, S. Loheide, T. Kleine-Besten, U. Brand and A. Schlachetzki, 'Methods of Characterising Micro Mechanical Beams and its Calibration for the Application in Micro force Measurement System,' Proc. of the MICRO rec 2000 Conference, pp. 819-823, 2000
- L. Doering and U. Brand, 'Si-Cantilevers with Integrated Piezo Resistive Elements as Micro Force Transfer Standards,' Pro. Nanoscale 2001, 2001