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Effects of Leveler on the Trench Filling during Damascene Copper Plating

전해전착시 상감 구리 배선의 충전에 미치는 레벨러의 효과

  • Lee, Yu-Young (Eco-Nano Research Center, Korea Institute of Science and Technology, School of Metallurgy & Materials Engineering, Kookmin University) ;
  • Park, Young-Joon (Nano Device Research Center, Korea Institute of Science and Technology, School of Metallurgy & Materials Engineering, Kookmin University) ;
  • Lee, Jae-Bong (School of Metallurgy & Materials Engineering, Kookmin University) ;
  • Cho, Byung-Won (Eco-Nano Research Center, Korea Institute of Science and Technology)
  • 이유용 (한국과학기술연구원 나노환경연구센터, 국민대학교 금속공학과) ;
  • 박영준 (한국과학기술연구원 나노소자연구센터) ;
  • 이재봉 (국민대학교 금속공학과) ;
  • 조병원 (한국과학기술연구원 나노환경연구센터)
  • Published : 2002.08.01

Abstract

The effects of leveler on the copper trench filling were investigated during damascene plating process. To investigate the trench filling effect with the addition of a leveler, a cross-section images of the electroplated trenches with the width of$0.37{\mu}m,\;and\;0.18{\mu}m$ were observed by field emission scanning electron microscope (FE-SEM). Polyethylene glycol(PEG), 3-mercapto-1-propanesulfonic acid and Janus Green B were used as a carrier, an accelerator and a leveler. $0.37{\mu}m$ trenches were superfilled without voids, but there was voids formation in $0.18{\mu}m$ trenches when the leveler was not added into the electrolyte. On the other hand $0.18{\mu}m$ trenches were superfilled without voids with the addition of the leveler due to the reduction growth rate of copper at protrusions and edges, which yield smooth final deposit surface. The leverer effect becomes more significant as the width of trenches becomes smaller when trenches are filed.

전해전착법을 이용한 상감(damascene)구리 배선 충전시 레벨러 효과에 대해 연구하였다. 레벨러를 첨가한 도금액과 첨가하지 않은 도금액을 제조하여 선 폭이 $0.37{\mu}m,\;0.18{\mu}m$인 선형 트렌치를 충전한 후 field emission scanning electron microscope(FE-SEM)로 트렌치 단면을 관찰하였다. 레벨러로 Janus Green B를 사용하였으며, 억제제로서 polyethylene glycol(PEG), 촉진제로서 3-mercapto-1-propansulfonic acid를 사용하였다 레벨러를 첨가하지 않은 경우 $0.37{\mu}m$(종횡비 2.7:1) 트렌치를 공극 없이 충전할 수 있었으나 $0.18{\mu}m$(종횡비 5.25:1) 트렌치에서는 공극(void)이 형성되었다. 레벨러를 첨가한 경우에는 $0.18{\mu}m$ 트렌치를 공극 없이 충전할 수 있었다. 레벨러를 첨가하지 않은 경우 트렌치 모서리에서의 전착속도를 충분하게 억제하지 못하고 거칠게 전착되어 미세한 트렌치 충전시 공극을 형성한 반면, 레벨러를 첨가한 경우는 트렌치 상부모서리에서의 전착속도를 억제하고 균일한 전착을 유도하여 미세한 트렌치를 공극 없이 채울 수 있었다.

Keywords

References

  1. International Electron Devices Meeting Technical Digest, IEEE 773 D. Edelstein;J. Heidenreich;R. Goldblatt;W. Cote;C. Uzoh;N. Lustig;P. Roper;T. McDevitt;W. Motsiff;A. Simon;J. Dukovic;R. Wachnik;H. Rathore;R. Schulz;R. Su;S. Luce;J. Slattery
  2. Korean Journal of Materials Research v.9 no.2 Dong-won Kim;In-Ho Kweon
  3. Critical Reviews in Solid State and Mater. Sci. v.20 S. P. Muraka;S. W. Hymes https://doi.org/10.1080/10408439508243732
  4. J. Electrochem. Soc. v.144 no.6 T. Smy;L. Tan;S. K. Dew;M. K. Brett;Y. Shacham-Diamand;M. Desilva https://doi.org/10.1149/1.1837750
  5. J. Appl. Phys. v.82 no.9 Aaron Burke;Gregory Braeckelmann;Dirk Manger;Eric Eisenbraun;Alain E. Kaloyeros;Jim P. McVittie;Joesph Han;David Bang;Kames F. Loan;John J. Sullivan https://doi.org/10.1063/1.366204
  6. Solid State Technology M. E. Gross;C. Linnk;W. L. Brown;R. Drese
  7. Korean J. Material Reserch v.9 no.6 Yong-An Kim;Sung-Hoon Yang;Seoghyeong Lee;Kyeong-Woo Lee;Jong-Wan Park
  8. J. Vac. Sci. Technol. A v.18 no.2 W. C. Gau;T. C. Chang;Y. S. Lin;J. C. Hu;L. J. Chen;C. Y. Chang;C. L. Cheng https://doi.org/10.1116/1.582243
  9. J. Vac. Sci. Technol. B v.18 no.6 Shao-Yu Chiu;Jia-Min Shieh-Chieh Chang;Kun-Cheng Lin;Bau-Tong Dai;Chia-Fu Chen;Ming-Shiann Feng https://doi.org/10.1116/1.1322042
  10. Electrochemical Society Proceeding v.98-6 A. Krishnamoorthy;C. Y. Lee;D. J. Duquette;S. P. Murarka
  11. Mar. Res. Soc. Symp. Proc. Robert D. Mikkoka;Qing-Tang Jiang(et al.)
  12. Electrochemical and Solid-State Letters v.4 no.4 T. P. Moffat;D. Wheeler;W. H. Huber;D. Josell https://doi.org/10.1149/1.1354496
  13. Physical Review Letters v.87 no.1 D. Josell;D. WHeeler;W. H. Huber;T. P. Moffat https://doi.org/10.1103/PhysRevLett.87.016102
  14. Conferene Proceedings ULSI XV ⓒ2000 Materials Research Society Tom Ritzdorf;Dakin Fulton;Linlin Chen https://doi.org/10.1103/PhysRevLett.87.016102
  15. Journal of The Electrochemical Society v.146 no.7 James J. Kelly;Chunyan Tian;Alan C. West
  16. J. Electrochem. Soc. v.145 no.10 James J. Kelly;Alan C. West https://doi.org/10.1149/1.1838829
  17. Solid State Technology Zhi-Wen Sun;Girish Dixit https://doi.org/10.1149/1.1838829
  18. Plating & Surface Finishing R. D. Mikkola;Q.-T. Jiang;B. Carpenter
  19. Solid State Technology Gautem Banerjee;Joseph So;Bob Mikkola
  20. Solid State Technology Jon Reid;Steve Mayer;Eliot Broadbent;Erich Klawnhn;Kaihan Ashtiani
  21. Solid State Technology Robert L. Jackson;Eliot Broadbent;Theodore Cacouris;Alain Harrus;Maximillian Biberger;Evan Patton;Tom Walsh
  22. 鍍金 · 表面處理, 康熙澤, 李柱性 文運堂
  23. Journal of Electrochemical Society v.146 no.1 A. Marlot;J. Vedel https://doi.org/10.1149/1.1391583
  24. Electrochemical Communications v.2 Yann Ratieuville;Philippe Viers;Jean Alexandren Cerard Durand https://doi.org/10.1149/1.1391583
  25. Yann Ratieuville, Philippe Viers, Jean Alexandrem Cerard Durand, Electrochemical Communications 2, 839(2000). https://doi.org/10.1016/S1388-2481(00)00133-8

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