Carbon letters
- Volume 2 Issue 3_4
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- Pages.202-211
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- 2001
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- 1976-4251(pISSN)
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- 2233-4998(eISSN)
Principle of Field Emission-Scanning Electron Microscopy (FE-SEM) and its Application to the Analysis of Carbon Nanostructures
- Kim, Young-Jeon (Enviro-Polymers Design Laboratory, Hyperstructured Organic Materials Research Center and School of Materials Science and Engineering, Seoul National University) ;
- Park, Chong-Rae (Enviro-Polymers Design Laboratory, Hyperstructured Organic Materials Research Center and School of Materials Science and Engineering, Seoul National University)
- Received : 2001.10.07
- Accepted : 2001.11.09
- Published : 2001.12.30
Abstract
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