-A study on Optimal Cost Model of Combined ESS and Burn-in under Warranty Policy-

품질보증정책하에 ESS와 Burn-in을 결합한 최적비 용모형 의 설정$^{1)}$

  • 송서일 (동아대학교 산업시스템공학과) ;
  • 조영찬 (동아대학교 산업시스템공학과) ;
  • 박현규 (동아대학교 산업시스템공학과)
  • Published : 2001.02.01

Abstract

The electronics industry is fast growing segment of manufacturing and service industries. It is important that the manufacturer develops a product with adequate life cycle, high quality, and low failure rate in the specified time period. Environmental Stress Screening(ESS) and burn-in are widely used in the electronic industry to assist in the elimination of early failure. In this research, we construct optimal cost model of combined ESS and burn-in under various warranty policy and establish optimal testing times for given environments. Also we conduct sensitivity analysis on various parameter. The results of this study are summarized as follows. Comparing free warranty policy to rebate warranty policy, optimal ESS time is longer under free warranty policy, and optimal burn-in time is longer under rebate warranty policy. Free warranty policy higher than rebate warranty policy in total cost.

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