Modified Two-Level Skip-Lot Sampling Plans

수정된 2단계 스킾-로트 샘플링 검사계획

  • 최병철 (전북대학교 수학통계정보과학부) ;
  • 천영민 (전북대학교 대학원 컴퓨터통계정보학과)
  • Published : 2001.03.01

Abstract

Skip-lot sampling plans for lot-by-lot inspection are more desirable than the continuous sampling plans for units in modern mass production system under the condition of the submitted product is good. Perry(1973a, 1973b) extended the Dodge(1955)′s skip-lot sampling plans to single and two-level skip-lot sampling plans and Parker & Kessler (1981) modified Perry(1973a)′s plans so that a sample of size one is taken from every lot skipped during the skipping mode. In this paper, Perry(1973b)′s two-level skip-lot sampling plans are modified by applying Parker & Kessler′s plan, designated as MTSkSP1, MTSkSP2, MTSkSP3. Operating characteristic(OC) functions, average sample numbers(ASN) and average outgoing qualities(AOQ) for the proposed plans are derived using Markov chain properties and compared each other and Perry′s plans. The proposed plans not only reduce the ASN but also avoid the danger skipping lots entirely when the lots are produced during sudden "out-of-control".

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