International Journal of Precision Engineering and Manufacturing
- 제2권2호
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- Pages.11-16
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- 2001
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- 2234-7593(pISSN)
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- 2005-4602(eISSN)
A New Calibration Method of Atomic Force Microscopy
- Hyunkyu Kweon (School of Mechanical Engineering, Kumoh National University of Technology, Kyunbuk)
- 발행 : 2001.07.01
초록
This paper presents an in self-calibration method to corrent the Z-directional distortion of AFM(Atomic Force Microscopy).
키워드