Journal of the Institute of Electronics Engineers of Korea SP (대한전자공학회논문지SP)

The Institute of Electronics and Information Engineers (대한전자공학회)
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Feature Extraction Method Using the Bhattacharyya Distance

Bhattacharyya distance 기반 특징 추출 기법

  • Choi, Eui-Sun (Dept. Electrical and Electronic Eng., Yonsei University) ;
  • Lee, Chul-Hee (Dept. Electrical and Electronic Eng., Yonsei University)
  • 최의선 (연세대학교 전기.전자공학과) ;
  • 이철희 (연세대학교 전기.전자공학과)
  • Published : 2000.11.25
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Abstract

In pattern classification, the Bhattacharyya distance has been used as a class separability measure. Furthemore, it is recently reported that the Bhattacharyya distance can be used to estimate error of Gaussian ML classifier within 1-2% margin. In this paper, we propose a feature extraction method utilizing the Bhattacharyya distance. In the proposed method, we first predict the classification error with the error estimation equation based on the Bhauacharyya distance. Then we find the feature vector that minimizes the classification error using two search algorithms: sequential search and global search. Experimental reslts show that the proposed method compares favorably with conventional feature extraction methods. In addition, it is possible to determine how man, feature vectors arc needed for achieving the same classification accuracy as in the original space.

Bhattacharyya distance는 패턴 분류 문제에 있어서 클래스간 분리도 측정의 수단으로 사용되어 왔으며 특징 추출 시 유용한 정보를 제공한다. 본 논문에서는 최근 발표된 Bhattacharyya distance를 이용한 에러 예측 기법을 이용하여 예측된 분류 에러가 최소가 되는 특정 벡터를 추출하는 방법에 대하여 제안한다. 제안한 특징 추출 기법은 최적화 알고리즘인 전체탐색 및 순차탐색 방법의 적용 시 분류 에러를 직접 구하지 않고 Bhattacharyya distance를 이용하여 분류 에러를 예측하므로 고차원 데이터의 경우 고속의 특징 추출이 가능하며, 에러 예측 성질을 이용하여 패턴 분류 시 필요한 최소 특징 벡터의 수를 예측할 수 있는 장점이 있다.

Keywords

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