Journal of Korean Society for Quality Management (품질경영학회지)
- Volume 28 Issue 2
- /
- Pages.70-88
- /
- 2000
- /
- 1229-1889(pISSN)
- /
- 2287-9005(eISSN)
Comparison of Statistical Process Control Techniques for Short Production Run
단기 생산공정에 활용되는 SPC 기법의 비교 연구
- Seo, Sun-Keun (Dept. of Industrial & Systems Engineering, Dong-A University) ;
- Lee, Sung-Jae (Dept. of Industrial & Systems Engineering, Dong-A University) ;
- Kim, Byung-Tae (Samsung Aerospace Industries, Ltd. (Plant #2), Program Management Unit)
- Published : 2000.06.01
Abstract
Short runs where it is neither possible nor practical to obtain sufficient subgroups to estimate accurately the control limit are common in modem business environments. In this study, the standardized control chart, Hillier's exact method, Q chart, EWMA(Exponentially Weighted Moving Average) chart for Q statistics and EWMA chart for mean and absolute deviation among many SPC(Statistical Process Control) techniques for short runs have been reviewed and advantages and disadvantages of these techniques are discussed. The simulation experiments to compare performances of these variable charts for process mean and variations are conducted for combination of subgroup size, scale and timing of shifts of process mean an/or standard deviation. Based upon simulation results, some guidelines for practitioners to choose short run SPC techniques are recommended.
Keywords