A Bayesian Burn-in Procedure Guaranteeing Outgoing Quality of a Product

출검품질 보증을 위한 베이지안 번인시험방식 설계

  • Kwon, Young-Il (Dept. of Industrial and Systems Eng., Chongju University)
  • 권영일 (청주대학교 산업공학과)
  • Published : 2000.12.01

Abstract

A Bayesian burn-in procedure is developed for imited failure populations in which defective items fail soon after they are put in operation and non-defective ones never fail during he technical life of the items. Sequential schemes guaranteeing pre-specified outgoing quality of a product are derived based on prior information on the quality of a product and accumulated failure information up to the decision point. A numerical example is also provided.

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