International Journal of Reliability and Applications
- 제1권1호
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- Pages.89-104
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- 2000
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- 1598-0073(pISSN)
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- 2283-8914(eISSN)
A Study on the Accelerated Life Test for Evaluating the Reliability of Nickel-Cadmium Batteries
- Kwon, Soo-Ho (Reliability Team, Q & R Center LG Electronics, Inc.) ;
- Huh, Yang-Hyun (Reliability Team, Q & R Center LG Electronics, Inc.) ;
- Lim, Tae-Jin (Department of Industrial Engineering Soong-sil University)
- 발행 : 2000.06.01
초록
Accelerated testing consists of a variety of test methods for shortening the life of products or hastening the degradation of their performance. This paper presents practical, modern statistical methods for evaluating the reliability of Nickel-Cadmium batteries at their design temperature of 2
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