International Journal of Reliability and Applications
- Volume 1 Issue 1
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- Pages.89-104
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- 2000
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- 1598-0073(pISSN)
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- 2283-8914(eISSN)
A Study on the Accelerated Life Test for Evaluating the Reliability of Nickel-Cadmium Batteries
- Kwon, Soo-Ho (Reliability Team, Q & R Center LG Electronics, Inc.) ;
- Huh, Yang-Hyun (Reliability Team, Q & R Center LG Electronics, Inc.) ;
- Lim, Tae-Jin (Department of Industrial Engineering Soong-sil University)
- Published : 2000.06.01
Abstract
Accelerated testing consists of a variety of test methods for shortening the life of products or hastening the degradation of their performance. This paper presents practical, modern statistical methods for evaluating the reliability of Nickel-Cadmium batteries at their design temperature of 2
Keywords
- Accelerated testing;
- reliability of Nickel-Cadmium batteries;
- Weibull distribution;
- Kolmogorov-Smirnov test;
- pairwise t-test;
- Arrhenius life-temperature relationship