Journal of the Institute of Electronics Engineers of Korea SD (대한전자공학회논문지SD)

The Institute of Electronics and Information Engineers (대한전자공학회)
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Extracting and Characterization of the Base Resistance based on Analysis of the Equivalent Noise Circuit for Common Collector

공통컬렉터 잡음등가회로 해석에 의한 베이스저항의 추출 및 특성

  • Gu, Hoe-U (Dept.of Electronics Engineering Chung Buk, National University) ;
  • Lee, Gi-Yeong (Dept.of Electronics Engineering Chung Buk, National University)
  • Published : 2000.02.01
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Abstract

We presented a method for extracting the base resistance r/sun bb/ based on analysis of the equivalent noise circuit for common collector. Measurements were conducted on devices with poly-emitter structure fabricated by BiCMOS process. Base resistance measurements have been performed for different base currents and structure. For low base current it is shown that the experimental data agree with theoretical expectations.

공통컬렉터 잡음등가회로 해석에 기초한 베이스저항 추출방법을 제시하였다. 측정은 BiCMOS공정으로 제조되고 폴리에미터 구조를 갖는 소자에 대해서 실행 되었다. 베이스저항 측정은 서로 다른 베이스전류와 구조에 따라 수행되었다. 낮은 베이스전류에서 측정된 실험값은 이론적으로 예측된 값과 매우 잘 일치하는 결과를 얻었다

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References

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