Implementation of recognition system on extracting inferior goods of radiation fin

방열판 불량품 추출을 위한 식별 시스템 구현

  • Sim, Woo-Sung (Dept.of Electronics Information Engineering, Engineering College, Wonkwang University) ;
  • Huh, Do-Geun (Dept.of Electronics Information Engineering, Engineering College, Wonkwang University) ;
  • Lee, Yong-Sik (Dept.of Electronics Information Engineering, Engineering College, Wonkwang Universi)
  • 심우성 (원광대학교 전자공학과) ;
  • 허도근 (원광대학교 전자공학과) ;
  • 이용식 (원광대학교 전자공학과)
  • Published : 2000.01.01

Abstract

In this paper, the illuminator is designed to recognize the shape and the existence of holes of radiation fin in the point that the light reflection characteristics are different according to the roughness of the material. The threshold value, the positions of holes and the black pixel nembers in the positon are obtained under the illuminator, in accordance with the reference image, by applying binary conversion and hole segmentation algorithm, as they are suggested in this paper, The existence and shape of hole are recognized by calculating the distance and feature value in the test image, which is obtained from the parameters of reference image. It is programmed to apply to GUI(Graphic User the Interface) in windows. More than 98% of recognition rate is shown, as it is applied to three different sizes of the radiation fin.

Keywords

References

  1. HON-SON DON, KING-SUN FU, C. R. LIU, Using Image Processing Techniques, IEEE WEI-CHUNG LIN, Metal Surface Inspection Trans. Sys. Man. Cybernetics, vol. SMC-14, no. 1, pp. 139-146, 1984
  2. L. jorge, C. Sanz, 'Machine vision algorithms for automated inspection of thin-film disk heads,' IEEE trans. Pattern Anal. Machine Intell, vol. 10, no. 6, pp. 830-848, 1998 https://doi.org/10.1109/34.9106
  3. Gonzale and Woods, 'Digital image processing,' Addison wesly, 1992
  4. 연구보고서, 'PCB 패턴의 고속정밀 Vision검사 시스템 개발,' KETI, 1994
  5. David W. Capson and SAI-KIT ENG, 'A tiered-color illumination approach for machine inspection of solder joint' IEEE Trans. Pattern Anal. Machine Intell, vol. 10, no. 3, pp.387-393, 1998 https://doi.org/10.1109/34.3902
  6. 허도근, 심우성, '순차적 기법에 의한 문서의 문자분리,' 대한 전자공학회 하계 학술 논문집, vol. 18, pp. 998-1001, 1995
  7. 김경민외 5인, '냉연 표면흠 검사 알고리듬 개발에 관한 연구,' 제어.자동화.시스템 공학, vol. 3, no. 2, pp. 179-186, 1997
  8. 박문수외 2인, '영상처리를 이용한 금속 Grain Size 측정시스템,' 제어계측.자동화 로보틱스 연구회 합동 학술 발표회, pp. 132-135, 1998